4 results on '"Endo, Katsuyoshi"'
Search Results
2. Fabrication of X-ray Mirror for Hard X-ray Diffraction Limited Nanofocusing
3. Surface Gradient Integrated Profiler for X-ray and EUV Optics—Calibration of the rotational angle error of the rotary encoders
4. Development of a Scanning X-ray Fluorescence Microscope Using Size-Controllable Focused X-ray Beam from 50 to 1500nm
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.