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We investigated the magnetoelectric properties of Cr2O3/Co all-thin-film exchange coupling system with Cr spacer layer. In this system, significantly small coercivity (Hc<50Oe) was obtained by the Cr spacer layer insertion between Cr2O3 and Co layers. Owing to the small Hc, exchange bias field, Hex, larger than Hc was achieved. It enabled us to observe magnetization switching at a zero magnetic field, when Hex was reversed by magnetoelectric effect of Cr2O3 layer. Finally, we demonstrated the isothermal magnetoelectric switching of magnetization in the Cr2O3/Cr/Co all-thin-film system. By changing the direction of the electric field during the isothermal magnetoelectric switching process, both Hex and magnetization at a zero magnetic field were reversed back and forth, i.e., isothermal magnetization switching by an electric field was achieved. [ABSTRACT FROM AUTHOR]

We investigated the effect of Pt insertion on a Cr2O3/Co exchange coupling system. The perpendicular exchange bias μ0Hex decreased with increasing Pt insertion layer thickness, and we observed positive μ0Hex for samples with relatively thick Pt insertion layers. We also examined the cooling field μ0Hfc dependence of μ0Hex for the samples. At small μ0Hfc, all samples exhibited negative μ0Hex. With increasing μ0Hfc, a shift of μ0Hex from negative to positive was observed. In the past, similar behaviors were observed for FeF2/Fe systems exhibiting positive μ0Hex. In addition, the μ0Hfc dependence of μ0Hex was well fitted by an equation taking into account the Zeeman energy at the surface of an antiferromagnet as well as an antiferromagnetic exchange coupling. The results strongly suggest that (1) Cr2O3 surface spin is affected by the external magnetic field and (2) the coupling at the Cr2O3/Pt/Co interface is antiferromagnetic. [ABSTRACT FROM AUTHOR]

We investigate the magnetic, electric, and magnetoelectric properties of a Cr2O3 thin film system that was deposited by radiofrequency magnetron sputtering. The temperature dependence of the magnetic susceptibility of our Cr2O3 film is similar to that of bulk Cr2O3, which indicates a small oxygen non-stoichiometry in the film. The Cr2O3 film exhibits high AC resistivity (∼109 Ωcm) and low leakage current (4.0×10-5 A/cm2 at E=80 kV/cm). Finally, we demonstrate magnetoelectric switching of the exchange bias using the Cr2O3/Pt/Co all-thin-film system. By changing the direction of the electric field during the magnetoelectric field cooling process, the exchange bias field was changed symmetrically from -160 Oe to +160 Oe, which represents the switching of the antiferromagnetic domain of Cr2O3. [ABSTRACT FROM AUTHOR]