1. Lifetime study of N impurity states in GaAs1-xNx (x=0.1%) under hydrostatic pressure.
- Author
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Wang, W. J., Yang, X. D., Ma, B. S., Sun, Z., Su, F. H., Ding, K., Xu, Z. Y., Li, G. H., Zhang, Y., Mascarenhas, A., Xin, H. P., and Tu, C. W.
- Subjects
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PHOTOLUMINESCENCE , *HYDROSTATIC pressure , *IMPURITY distribution in semiconductors , *ELECTRON emission , *BINDING energy , *ELECTRODES - Abstract
The lifetimes of a series of N-related photoluminescence lines (A2–A6) in GaAs1-xNx (x=0.1%) were studied under hydrostatic pressures at ∼30 K. The lifetimes of A5 and A6 were found to increase rapidly with increasing pressure: from 2.1 ns at 0 GPa to more than 20 ns at 0.92 GPa for A5 and from 3.2 ns at 0.63 GPa to 10.8 ns at 0.92 GPa for A6. The lifetime is found to be closely correlated with the binding energy of the N impurity states, which is shown either in the pressure dependence for a given emission line or in the lifetime variation from A2 to A6. [ABSTRACT FROM AUTHOR]
- Published
- 2006
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