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3. Comparative study of defect energetics in HfO2 and SiO2

4. Topological states of nanoscale Bi2Se3 interfaced with AlN

5. Ab initio calculations of vacancies in SixGe1−x

6. Stacking fault effects in pure and n-type doped GaAs

8. Carbon doping of GaAs: Compensation effects

9. Topological states of nanoscale Bi2Se3 interfaced with AlN.

17. Comparative study of defect energetics in HfO[sub 2] and SiO[sub 2].

18. A universal trend in the binding energies of deep impurities in semiconductors

19. A universal trend in the binding energies of deep impurities in semiconductors.

20. Evidence of 2D intersubband scattering in thin film fully depleted silicon-on-insulator transistors operating at 4.2 K

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