1. Semiconducting lithium indium diselenide: Charge-carrier properties and the impacts of high flux thermal neutron irradiation
- Author
-
Elan Herrera, Vladimir Buliga, Ashley C. Stowe, Michael Groza, Eric Lukosi, Arnold Burger, Mikah Rust, Liviu Matei, Jeff Preston, and Daniel Hamm
- Subjects
010302 applied physics ,Deep-level transient spectroscopy ,Materials science ,Physics and Astronomy (miscellaneous) ,Analytical chemistry ,chemistry.chemical_element ,02 engineering and technology ,Alpha particle ,021001 nanoscience & nanotechnology ,01 natural sciences ,Neutron temperature ,chemistry ,0103 physical sciences ,Neutron detection ,Neutron ,Lithium ,Charge carrier ,Irradiation ,0210 nano-technology - Abstract
This paper reports on the charge carrier properties of several lithium indium diselenide (LISe) semiconductors. It was found that the charge collection efficiency of LISe was improved after high flux thermal neutron irradiation including the presence of a typically unobservable alpha peak from hole-only collection. Charge carrier trap energies of the irradiated sample were measured using photo-induced current transient spectroscopy. Compared to previous studies of this material, no significant differences in trap energies were observed. Through trap-filled limited voltage measurements, neutron irradiation was found to increase the density of trap states within the bulk of the semiconductor, which created a polarization effect under alpha exposure but not neutron exposure. Further, the charge collection efficiency of the irradiated sample was higher (14–15 fC) than that of alpha particles (3–5 fC), indicating that an increase in hole signal contribution resulted from the neutron irradiation. Finally, it was observed that significant charge loss takes place near the point of generation, producing a significant scintillation response and artificially inflating the W-value of all semiconducting LISe crystals.This paper reports on the charge carrier properties of several lithium indium diselenide (LISe) semiconductors. It was found that the charge collection efficiency of LISe was improved after high flux thermal neutron irradiation including the presence of a typically unobservable alpha peak from hole-only collection. Charge carrier trap energies of the irradiated sample were measured using photo-induced current transient spectroscopy. Compared to previous studies of this material, no significant differences in trap energies were observed. Through trap-filled limited voltage measurements, neutron irradiation was found to increase the density of trap states within the bulk of the semiconductor, which created a polarization effect under alpha exposure but not neutron exposure. Further, the charge collection efficiency of the irradiated sample was higher (14–15 fC) than that of alpha particles (3–5 fC), indicating that an increase in hole signal contribution resulted from the neutron irradiation. Finally, it wa...
- Published
- 2018
- Full Text
- View/download PDF