Author: "BONERA, EMILIANO" / Journal: applied physics letters - Searchworks@Jio Institute Digital Library Search Results

Searchworks

Select search scope, currently: Articles

Catalog

books, media & more in Jio Institute collections

Articles

journal articles & other e-resources

Your search keyword '"BONERA, EMILIANO"' showing total 7 results

Start Over Author "BONERA, EMILIANO" Journal applied physics letters

7 results on '"BONERA, EMILIANO"'

1. Tensile strain in Ge membranes induced by SiGe nanostressors

Author: Barget, Michael R., primary, Lodari, Mario, additional, Borriello, Mauro, additional, Mondiali, Valeria, additional, Chrastina, Daniel, additional, Bollani, Monica, additional, and Bonera, Emiliano, additional
Published: 2016
Full Text: View/download PDF

2. Disentangling nonradiative recombination processes in Ge micro-crystals on Si substrates

Author: Pezzoli, Fabio, primary, Giorgioni, Anna, additional, Gallacher, Kevin, additional, Isa, Fabio, additional, Biagioni, Paolo, additional, Millar, Ross W., additional, Gatti, Eleonora, additional, Grilli, Emanuele, additional, Bonera, Emiliano, additional, Isella, Giovanni, additional, Paul, Douglas J., additional, and Miglio, Leo, additional
Published: 2016
Full Text: View/download PDF

3. Local uniaxial tensile strain in germanium of up to 4% induced by SiGe epitaxial nanostructures

Author: Bollani, Monica, primary, Chrastina, Daniel, additional, Gagliano, Luca, additional, Rossetto, Lidia, additional, Scopece, Daniele, additional, Barget, Michael, additional, Mondiali, Valeria, additional, Frigerio, Jacopo, additional, Lodari, Mario, additional, Pezzoli, Fabio, additional, Montalenti, Francesco, additional, and Bonera, Emiliano, additional
Published: 2015
Full Text: View/download PDF

4. Monolithic integration of optical grade GaAs on Si (001) substrates deeply patterned at a micron scale

Author: Bietti, Sergio, primary, Scaccabarozzi, Andrea, additional, Frigeri, Cesare, additional, Bollani, Monica, additional, Bonera, Emiliano, additional, Falub, Claudiu V., additional, von Känel, Hans, additional, Miglio, Leo, additional, and Sanguinetti, Stefano, additional
Published: 2013
Full Text: View/download PDF

5. Dislocation distribution across ultrathin silicon-on-insulator with epitaxial SiGe stressor

Author: Bonera, Emiliano, primary, Gatti, Riccardo, additional, Isella, Giovanni, additional, Norga, Gerd, additional, Picco, Andrea, additional, Grilli, Emanuele, additional, Guzzi, Mario, additional, Texier, Michaël, additional, Pichaud, Bernard, additional, von Känel, Hans, additional, and Miglio, Leo, additional
Published: 2013
Full Text: View/download PDF

6. Raman spectroscopy of strain in subwavelength microelectronic devices

Author: Bonera, Emiliano, primary, Fanciulli, Marco, additional, and Mariani, Marcello, additional
Published: 2005
Full Text: View/download PDF

7. Raman spectroscopy for a micrometric and tensorial analysis of stress in silicon

Author: Bonera, Emiliano, primary, Fanciulli, Marco, additional, and Batchelder, David N., additional
Published: 2002
Full Text: View/download PDF

Catalog

Books, media, physical & digital resources

See catalog results