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Your search keyword '"Baker, S. L."' showing total 4 results
Start Over Author "Baker, S. L." Journal applied physics letters
4 results on '"Baker, S. L."'

1. Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation

Author

Hau-Riege, S. P., primary, London, R. A., additional, Bionta, R. M., additional, Ryutov, D., additional, Soufli, R., additional, Bajt, S., additional, McKernan, M. A., additional, Baker, S. L., additional, Krzywinski, J., additional, Sobierajski, R., additional, Nietubyc, R., additional, Klinger, D., additional, Pelka, J. B., additional, Jurek, M., additional, Juha, L., additional, Chalupský, J., additional, Cihelka, J., additional, Hájková, V., additional, Velyhan, A., additional, Krása, J., additional, Tiedtke, K., additional, Toleikis, S., additional, Wabnitz, H., additional, Bergh, M., additional, Caleman, C., additional, and Timneanu, N., additional

Published
2009
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2. Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5nm wavelength

Author

Hau-Riege, S. P., primary, London, R. A., additional, Bionta, R. M., additional, McKernan, M. A., additional, Baker, S. L., additional, Krzywinski, J., additional, Sobierajski, R., additional, Nietubyc, R., additional, Pelka, J. B., additional, Jurek, M., additional, Juha, L., additional, Chalupský, J., additional, Cihelka, J., additional, Hájková, V., additional, Velyhan, A., additional, Krása, J., additional, Kuba, J., additional, Tiedtke, K., additional, Toleikis, S., additional, Tschentscher, Th., additional, Wabnitz, H., additional, Bergh, M., additional, Caleman, C., additional, Sokolowski-Tinten, K., additional, Stojanovic, N., additional, and Zastrau, U., additional

Published
2007
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3. Ultrathick, low-stress nanostructured diamond films

Author

Kucheyev, S. O., primary, Biener, J., additional, Tringe, J. W., additional, Wang, Y. M., additional, Mirkarimi, P. B., additional, van Buuren, T., additional, Baker, S. L., additional, Hamza, A. V., additional, Brühne, K., additional, and Fecht, H.-J., additional

Published
2005
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4. Damage threshold of inorganic solids under free-electron-laser irradiation at 32.5 nm wavelength.

Author

Hau-Riege, S. P., London, R. A., Bionta, R. M., McKernan, M. A., Baker, S. L., Krzywinski, J., Sobierajski, R., Nietubyc, R., Pelka, J. B., Jurek, M., Juha, L., Chalupský, J., Cihelka, J., Hájková, V., Velyhan, A., Krása, J., Kuba, J., Tiedtke, K., Toleikis, S., and Tschentscher, Th.

Subjects
CHEMICAL vapor deposition, LASER beams, INORGANIC compounds, PARTICLES (Nuclear physics), WAVELENGTHS, THERMAL analysis, HEATS of vaporization
Abstract

Samples of B4C, amorphous C, chemical-vapor-deposition-diamond C, Si, and SiC were exposed to single 25 fs long pulses of 32.5 nm free-electron-laser radiation at fluences of up to 2.2 J/cm2. The samples were chosen as candidate materials for x-ray free-electron-laser optics. It was found that the threshold for surface damage is on the order of the fluence required for thermal melting. For larger fluences, the crater depths correspond to temperatures on the order of the critical temperature, suggesting that the craters are formed by two-phase vaporization. [ABSTRACT FROM AUTHOR]

Published
2007
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