22 results on '"Cai Z."'
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2. Submicron mapping of strain distributions induced by three-dimensional through-silicon via features
3. Antiferromagnetic domain wall engineering in chromium films
4. Effect of microstrain on the magnetism and magnetocaloric properties of MnAs0.97P0.03
5. Plasma confinement by hemispherical cavity in laser-induced breakdown spectroscopy
6. Strain measured in a silicon-on-insulator, complementary metal-oxide-semiconductor device channel induced by embedded silicon-carbon source/drain regions
7. Epitaxial MgO as an alternative gate dielectric for SiC transistor applications
8. Intrafacet migration effects in InGaN∕GaN structures grown on triangular GaN ridges studied by submicron beam x-ray diffraction
9. Soft magnetism, magnetostriction, and microwave properties of FeGaB thin films
10. Characterization of structure and morphology of an advanced p-channel field effect transistor under uniaxial stress by synchrotron x-ray diffraction
11. Submicron mapping of strained silicon-on-insulator features induced
12. Low temperature growth of crystalline magnesium oxide on hexagonal silicon carbide (0001) by molecular beam epitaxy
13. Impact of metal silicide precipitate dissolution during rapid thermal processing of multicrystalline silicon solar cells
14. Germanium hut nanostressors on freestanding thin silicon membranes
15. Mapping of strain fields about thin film structures using x-ray microdiffraction
16. Quantitative metrology study of Cu/SiO2 interconnect structures using fluorescence x-ray microscopy
17. X-ray microdiffraction study of Cu interconnects
18. Synchrotron x-ray microdiffraction diagnostics of multilayer optoelectronic devices
19. A kinetic mechanism for the formation of aligned (Bi,Pb)2Sr 2Ca2Cu3O10 in a powder‐in‐tube processed tape
20. Strain relaxation and surface migration effects in InGaAlAs and InGaAsP selective-area-grown ridge waveguides.
21. Quantitative metrology study of Cu/SiO[sub 2] interconnect structures using fluorescence x-ray microscopy.
22. Stressor-layer-induced elastic strain sharing in SrTiO3 complex oxide sheets.
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