4 results on '"Kim, Jang Hyun"'
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2. Investigation on the characteristics of stress-induced hump in amorphous oxide thin film transistors
3. Temperature effect on negative bias-induced instability of HfInZnO amorphous oxide thin film transistor
4. Charge injection from gate electrode by simultaneous stress of optical and electrical biases in HfInZnO amorphous oxide thin film transistor
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