1. Imaging interfacial electrical transport in graphene–MoS2 heterostructures with electron-beam-induced-currents
- Author
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White, ER, Kerelsky, Alexander, Hubbard, William A, Dhall, Rohan, Cronin, Stephen B, Mecklenburg, Matthew, and Regan, BC
- Subjects
Bioengineering ,Physical Sciences ,Engineering ,Technology ,Applied Physics - Abstract
Heterostructure devices with specific and extraordinary properties can be fabricated by stacking two-dimensional crystals. Cleanliness at the inter-crystal interfaces within a heterostructure is crucial for maximizing device performance. However, because these interfaces are buried, characterizing their impact on device function is challenging. Here, we show that electron-beam induced current (EBIC) mapping can be used to image interfacial contamination and to characterize the quality of buried heterostructure interfaces with nanometer-scale spatial resolution. We applied EBIC and photocurrent imaging to map photo-sensitive graphene-MoS2 heterostructures. The EBIC maps, together with concurrently acquired scanning transmission electron microscopy images, reveal how a device's photocurrent collection efficiency is adversely affected by nanoscale debris invisible to optical-resolution photocurrent mapping.
- Published
- 2015