10 results on '"Meneghesso, Gaudenzio"'
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2. Gate leakage modeling in lateral β-Ga2O3 MOSFETs with Al2O3 gate dielectric.
3. Logarithmic trapping and detrapping in β-Ga2O3 MOSFETs: Experimental analysis and modeling
4. Logarithmic trapping and detrapping in β-Ga2O3 MOSFETs: Experimental analysis and modeling.
5. Highly stable threshold voltage in GaN nanowire FETs: The advantages of p-GaN channel/Al2O3 gate insulator
6. Degradation of AlGaN/GaN Schottky diodes on silicon: Role of defects at the AlGaN/GaN interface
7. Degradation of AlGaN/GaN high electron mobility transistors related to hot electrons
8. Time-dependent degradation of AlGaN/GaN high electron mobility transistors under reverse bias
9. Analysis of the physical processes responsible for the degradation of deep-ultraviolet light emitting diodes
10. Evidence of interface trap creation by hot-electrons in AlGaAs/GaAs high electron mobility transistors
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