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The effect of varied concentrations of deuterium-krypton (D2–Kr) admixture on the neutron emission of a fast miniature plasma focus device was investigated. It was found that a judicious concentration of Kr in D2 can significantly enhance the neutron yield. The maximum average neutron yield of (1±0.27)×104 n/shot for pure D2 filling at 3 mbars was enhanced to (3.14±0.4)×105 n/shot with D2+2% Kr admixture operation, which represents a >30-fold increase. More than an order of magnitude enhancement in the average neutron yield was observed over the broader operating range of 1–4 mbars for D2+2% Kr and D2+5% Kr admixtures. [ABSTRACT FROM AUTHOR]

In a 200 J fast miniature plasma focus device about 17- and 10-fold increase in x-ray yield in spectral ranges of 0.9–1.6 keV and 3.2–7.7 keV, respectively, have been obtained with deuterium-krypton (D2–Kr) admixture at operating pressures of ≤0.4 mbar. In the pressure range of >0.4–1.4 mbar, about twofold magnification in average x-ray yield along with broadening of optimum pressure range in both spectral ranges were obtained for D2–Kr admixtures. An order of magnitude enhancement in x-ray yields at low pressures for admixture operation will help in achieving high performance device efficiency for lithography and micromachining applications [ABSTRACT FROM AUTHOR]