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[Display omitted] • Real space evidence of p4g(2 × 2) Fe 2 C and Co 2 C surface carbides. • Tip-sample distance dependent STM imaging of Fe 2 C. • Fe 2 X (X = B, C, N, O) with increasing electrons the reconstruction becomes less favourable. Thin FCC (1 0 0) iron and cobalt carbide films were prepared on Cu(1 0 0) to study the connection between their structure, electronic properties and stability. We present the first detailed, real space experimental confirmation of the C-induced clock reconstruction on the FCC(1 0 0) surfaces of iron and cobalt. Both Fe and Co surface carbides show p4g (2 × 2) surface reconstruction with tetracoordinated square planar carbon and pure FCC (1 0 0) metal layers underneath. Combining tip-sample distance dependent STM imaging with theoretical calculations we present different imaging modes of Fe 2 C. Using a combination of angle-resolved x-ray photoelectron spectroscopy (AR-XPS), Auger electron spectroscopy (AES), low energy electron diffraction (LEED), scanning tunneling microscopy (STM), and theoretical calculations we provide detailed electronic and structural models for Fe 2 C and Co 2 C p4g (2 × 2) surface carbides and other 2D Fe 2 X interstitial compound systems. In various Fe 2 X (X = B, C, N, O) surface compounds moving to the right in the periodic table with increasing electrons the reconstruction becomes less favorable, while iron carbide shows the highest stability. [ABSTRACT FROM AUTHOR]

[Display omitted] • Main features of GDOES, XPS and ToF-SIMS depth profiling of the thin amine polymer film are compared. • GDOES depth profiling in Ar/O 2 mixture increases etching rate and depth resolution for amine polymer film compared to pure Ar gas. • Etching of polymer surface by glow discharge of Ar/O 2 mixture is based on the synergy of ion sputtering and reactive chemical etching. • GDOES depth profiling is suitable for fast analyses of polymer layers up to a few μm in thickness. Thin polymer films were deposited on polished stainless-steel samples by PECVD from a cyclopropylamine precursor and characterized by X-ray photoelectron spectroscopy, secondary-ion mass spectrometry and glow-discharge optical emission spectroscopy (GDOES) depth profiling. These depth profiles exhibited reasonable agreement. The GDOES involved the erosion of the polymer films in plasma sustained by an asymmetric RF capacitively coupled discharge using both Ar and Ar-O 2 gases. The application of pure Ar caused unwanted effects, such as the broadening of the polymer-film/substrate interface, which were suppressed when using the mixture with oxygen. Another benefit of oxygen was a significant increase in the etching rate by a factor of about 15 as compared to pure argon. The mechanisms involved in the depth profiling using the mixture of gases were elaborated in some detail, taking into account plasma parameters typical for an asymmetric, capacitively coupled RF discharge in a small volume. The main benefit of using the Ar/O 2 GDOES profiling with respect to XPS and SIMS depth profiling is the increased sputtering rate for polymer films. Comparing the GDOES depth profiling with the Ar/O 2 mixture with profiling in pure Ar, the benefits are a higher sputtering rate and better depth resolution at the polymer/substrate interface. [ABSTRACT FROM AUTHOR]