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Your search keyword '"Mario Barozzi"' showing total 10 results

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10 results on '"Mario Barozzi"'

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1. Angle resolved XPS for selective characterization of internal and external surface of porous silicon

2. Influence of changes in the resistivity of the sample surface on ultra-shallow SIMS profiles for arsenic

3. Comparison between the SIMS and MEIS techniques for the characterization of ultra shallow arsenic implants

4. ToF-SIMS and AFM studies of low-k dielectric etching in fluorocarbon plasmas

5. Topography induced by sputtering in a magnetic sector instrument: an AFM and SEM study

6. Arsenic shallow depth profiling: accurate quantification in SiO2/Si stack

7. Short-term and long-term RSF repeatability for CAMECA SC-Ultra SIMS measurements

8. D-SIMS and ToF-SIMS quantitative depth profiles comparison on ultra thin oxynitrides

9. Boron ultra low energy SIMS depth profiling improved by rotating stage

10. Sample holder implement for very small samples on SC-ultra SIMS instrument

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