1. Simulation of the charge migration in DNA under irradiation with heavy ions
- Author
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Ianik Plante, Sergey E h Shirmovsky, Oleg Belov, and D. L. Boyda
- Subjects
Ions ,Physics ,Models, Statistical ,DNA damage ,Ion track ,Static Electricity ,Biomedical Engineering ,Charge (physics) ,General Medicine ,Radiation ,Radiation Dosage ,Charged particle ,Ion ,Biomaterials ,Models, Chemical ,Quantum Theory ,Particle ,Computer Simulation ,Heavy Ions ,Irradiation ,Atomic physics ,Cosmic Radiation ,DNA Damage - Abstract
A computer model to simulate the processes of charge injection and migration through DNA after irradiation by a heavy charged particle was developed. The most probable sites of charge injection were obtained by merging spatial models of short DNA sequence and a single 1 GeV/u iron particle track simulated by the code RITRACKS (Relativistic Ion Tracks). Charge migration was simulated by using a quantum-classical nonlinear model of the DNA-charge system. It was found that charge migration depends on the environmental conditions. The oxidative damage in DNA occurring during hole migration was simulated concurrently, which allowed the determination of probable locations of radiation-induced DNA lesions.
- Published
- 2015
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