1. New Chemical Method of Obtaining Thick Ga1-xMnxN Layers: Prospective Spintronic Material
- Author
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Krzysztof Wozniak, Lukasz Dobrzycki, Adam Barcz, Andrzej Twardowski, Rafal Jakiela, Michal Kaminski, Pawel Dominik, Slawomir Podsiadlo, Marcin Zajac, Jaroslaw Mizera, R. Bacewicz, and Marek Psoda
- Subjects
Diffraction ,Superconductivity ,Sublimation sandwich method ,Materials science ,Extended X-ray absorption fine structure ,Spintronics ,General Chemical Engineering ,Analytical chemistry ,General Chemistry ,Characterization (materials science) ,Crystallography ,Paramagnetism ,Atom ,Materials Chemistry - Abstract
The synthesis and characterization of Ga 1-x Mn x N thick layers are reported. The layers were prepared by the modified sublimation sandwich method (SSM) from GaN powder and powdered Mn sources and reacted with ammonia. Ga 1-x Mn x N layers having a current maximum size of 60 μm thickness and 10 mm x 10 mm area were obtained. The crystals of best crystalline quality were obtained with a growth rate of 25 μm/h. SIMS measurements showed the presence of layers containing up to 4 atom % Mn. Measurements involving X-ray diffraction (structure refinement), rocking curves, map of reflections, and EXAFS confirmed good structural properties without phase separation. The measurements carried out by a superconducting quantum interferometer showed that the material revealed typical paramagnetic properties.
- Published
- 2007
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