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The L-shell x-ray yields of Zr and Mo bombarded by slow Ar16+ions are measured. The energy of the Ar16+ions ranges from about 150 keV to 350 keV. The L-shell x-ray production cross sections of Zr and Mo are extracted from these yields data. The explanation of these experimental results is in the framework of the adiabatic direct-ionization and the binding energy modified BEA approximation. We consider, in the slow asymmetric collisions such as Ar and Mo/Zr, the transient united atoms (UA) are formed during the ion-surface interaction and the direct-ionization is the main mechanism for the inner-shell vacancy production. Generally, the theoretical results are in good agreement with the experimental data.

The relative partial cross sections for 13C6+–Ar collisions at 4.15–11.08 keV/u incident energy are measured. The cross-section ratios σ2E/σSC, σ3E/σSC, σ4E/σSC and σ5E/σSC are approximately the constants of 0.51±0.05, 0.20±0.03, 0.06±0.03 and 0.02±0.01 in this region. The significance of the multi-electron process in highly charged ions (HCIs) with argon collisions is demonstrated (σME/σSC as high as 0.79±0.06). In multi-electron processes, it is shown that transfer ionization is dominant while pure electron capture is weak and negligible. For all reaction channels, the cross-sections are independent of the incident energy in the present energy region, which is in agreement with the static characteristic of classic models, i.e. the molecular Coulomb over-the-barrier model (MCBM), the extended classical over-the-barrier model (ECBM) and the semiempirical scaling laws (SL). The result is compared with these classical models and with our previous work of 13C6+-Ne collisions [Chin. Phys. Lett. 23 (2006) 95].

The cross-section ratios of double-, triple-, quadruple-, and the total multi-electron processes to the single electron capture process (σDE/σSC, σTE/σSC, σQE/σSC and σME/σSC) as well as the relative ratios among reaction channels in double-electron active, triple-electron active and quadruple-electron active are measured in 13C6+–Ne collision in the energy region of 4.15–11.08 keV/u by employing position-sensitive and time-of-flight coincident techniques. It is determined that the cross-section ratios σDE/σSC, σTE/σSC, σQE/σSC and σME/σSC are approximately the constants of 0.20±0.03, 0.16±0.04, 0.06±0.02 and 0.42±0.05. These values are obviously smaller than the predictions of the molecular Coulomb over-the-barrier model (MCBM) [J. Phys. B 23 (1990) 4293], the extended classical over-the-barrier model (ECBM) [J. Phys. B 19 (1986) 2925] and the semiempirical scaling laws (SL) [Phys. Rev. A 54 (1996) 4127]. However, the relative ratios among partial processes of DE, TE and QE are found to depend on collision energy, which suggests that the collision dynamics depends on the collision velocity. The limitation of velocity-independent character of ECBM, MCBM and SL is undoubtedly shown.

We investigate angular distributions of the transmitted 60 keV and 120 keV O3+ ions through nanocapillaries with 50nm diameter and 10μm length. The experimental results are in agreement with the 'guiding effect' found by Stolterfoht et al. For different tilted angles of the nanocapillary membrane with respect to the beam, the angular distributions of the transmitted ions are measured by a one-dimensional micro-channel plate (MCP) detector. Moreover, the dependence of this guiding effect on the projectile energy is studied.

The Cu films are deposited on two kinds of p-type Si (111) substrates by ionized cluster beam (ICB) technique. The interface reaction and atomic diffusion of Cu/Si (111) and Cu/SiO2/Si (111) systems are studied at different annealing temperatures by x-ray diffraction (XRD) and Rutherford backscattering spectrometry (RBS). Some significant results are obtained: For the Cu/Si (111) samples prepared by neutral clusters, the interdiffusion of Cu and Si atoms occurs when annealed at 230?C. The diffusion coefficients of the samples annealed at 230?C and 500?C are 8.5 ? 10-15 cm2?s-1 and 3.0 ? 10-14 cm2?s-1, respectively. The formation of the copper-silicide phase is observed by XRD, and its intensity becomes stronger with the increase of annealing temperature. For the Cu/SiO2/Si (111) samples prepared by neutral clusters, the interdiffusion of Cu and Si atoms occurs and copper silicides are formed when annealed at 450?C. The diffusion coefficients of Cu in Si are calculated to be 6.0 ? 10-16 cm2?s-1 at 450?C, due to the fact that the existence of the SiO2 layer suppresses the interdiffusion of Cu and Si.

A simple model for the direct ionization and transfer ionization probabilities in A2+ +He collisions in a wide projectile energy range is proposed based on the Bohr–Lindhard model and the classical statistical model. The calculated cross sections are in satisfactory agreement with the experimental data available.

The multi-electron processes are investigated for 17.9–120 keV/u C1+, 30–323 keV/u C2+, 120–438 keV/u C3+, 287–480 keV/u C4+ incident on a helium target. The cross-section ratios of double electron (DE) process to the total of the single electron (SE) and the double electron process (i.e. SE+DE), the direct double electron (DDI) to the direct single ionization (DSI) as well as the contributions of DDI to DE and of TI to DE are measured using coincidence techniques. The energy and charge state dependences of the measured cross-section ratios are studied and discussed.

The isotopic bare ion 13C6+ was employed to collide with helium at 4.15–11.08 keV/u. The relative partial cross sections were measured by position-sensitive and time-of-flight coincident techniques. It is shown that the direct-ionization (DI) process can be completely ignored in this region, the transfer ionization (TI) process is the most important double-electron channel, and the probability of the pure double-electron capture (DC) process is quite small. The cross-section ratio of the total double-electron (DE) process (i.e. DC+TI) to the single-electron capture (SC) process is experimentally determined to be approximately a constant of 0.09±0.03 in this region, and this value is obviously smaller than the predictions of the classical over-barrier models and the semi-empirical scaling laws. It is found that the cross-section ratio of pure DC to DE decreases obviously as the projectile velocity increases. Because the pure DC process only comes from the radiation de-excitation following the DC process and are competed by the TI process (comes from the auto-ionization following the DC process), this implies that the population of the two captured electrons depends distinctly on the collision velocity. Comparison with works on Ar16+–He by Wu et al. [Phys. Rev. A 48 (1993) 3617] reveals that the strong projectile-dependent character of the pure DC process exists.

We study the L x-ray emission from Zr, Mo and In targets and M x-ray emission from Pb target under bombardment of low energy Arq+ (q = 13,14,15,16) ions. The relative x-ray yields were measured in the projectile kinetic energy range 210–360 keV. It is found that the relative x-ray yields from Zr, Mo and Pb targets increase with the increasing projectile kinetic energy for Ar14+ and Ar16+ projectiles and depend on the potential energy of the projectile remarkably.

The properties of the Z = 117 isotopic chain are studied within the framework of the axially deformed relativistic mean field theory (RMFT) in the blocked BCS approximation. The ground-state properties, such as binging energies, deformations as well as the possible.. decay energies and lifetimes are calculated with the parameter set of NL-Z2 and compared with results from the finite range droplet model. The analysis by RMFT shows that the isotopes in the range of mass number A = 291 similar to 300 exhibit higher stability, which suggests that they may be promising nuclei to be hopefully synthesized in the lab among the nuclei Z = 117.