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Start Over Author "Giorgio Pettinari" Journal communications materials
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1. Imaging shape and strain in nanoscale engineered semiconductors for photonics by coherent x-ray diffraction

Author

Felisa Berenguer, Giorgio Pettinari, Marco Felici, Nilanthy Balakrishnan, Jesse N. Clark, Sylvain Ravy, Amalia Patané, Antonio Polimeni, and Gianluca Ciatto

Subjects
Materials of engineering and construction. Mechanics of materials, TA401-492
Abstract

Coherent x-ray diffractive imaging is a powerful technique for determining strain on the nanometer scale. Here, it is used to image semiconducting GaAs1-yNy structures on a GaAs substrate and to measure strain, demonstrating its potential for studying highly strained interfaces in devices.

Published
2020
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