9 results on '"Joan Figueras"'
Search Results
2. Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation.
3. Robustness analysis of 6T SRAMs in memory retention mode under PVT variations.
4. Analog circuit test based on a digital signature.
5. Exploring the Combination of IDDQ and iDDt Testing: Energy Testing.
6. Testing the Configurable Interconnect/Logic Interface of SRAM-Based FPGA's.
7. RAM-Based FPGA's: A Test Approach for the Configurable Logic.
8. Novel Technique for Testing FPGAs.
9. Estimation of the Defective IDDQ Caused by Shorts in Deep-Submicron CMOS ICs.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.