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The article reports that Vishram Pandit of technology company Intel Corporation has won the Engineer of the Year Award at the DesignCon 2019 and for the Best Paper Award Finalist.

The article reports on the release of a white paper entitled "An Economical Alternative to Boundary Scan in Memory Devices," by the IEEE PI58I Working Group. The study offers an overview of the proposed standard that defines a low-overhead design-for-test methodology to be implemented in memory devices.

The article offers information on IEEE Microwave Theory and Techniques Society (MTT-S) International Microwave Symposium for microwave technologists, technical paper presentations, workshops and commercial exhibitions featuring equipment’s from Analog Devices, MathWorks and National Instruments.

The article discusses on the transformation of measuring electromagnetic interference (EMI) through digital EMI receivers. Topics mentioned include the compliance on Comité International Spécial des Perturbations Radioélectriques (CISPR) specifications to achieve the minimum performance speed levels, the white paper of measurement equipment maker Rohde & Schwarz that explains the benefits, and the insight of engineer Mark Terrien on fast fourier transform (FFT) analysis.

The article discusses the challenges of low-level signals measurement subject to thermally induced voltage errors or Seebeck effect as applied to low-level switching applications. Topics mentioned include the reed relay products from VTI instruments, Littlefuse general purpose HE3600 500-ma/200VDC reed relay and the National Instruments technical paper instructions to reduce thermal error voltages.

The article discusses the standards of electromagnetic compatibility (EMC) testing. A brief overview is given on two actual test examples which illustrate the range of situations facing EMC test laboratories. It describes the EMC test compliance achieved by Komatsu and General Motors. It also discusses the approach for dealing with EMC for one's next design project. Information is given on the evolution of EMC standards and EMC requirements. It outlines the specific recommendations of the Intertek white paper involving EMC test compliance.

The article discusses several forms of vision system user online help. A selection matrix is the most common form of user help on many web sites and in most cases, these are product-oriented rather than application-oriented. Other sources of user help include technical notes, case studies and white papers which can provide useful information. A number of companies also publish their own online newsletters, which often contain helpful application stories. On the other hand, training programs are offered by many suppliers.

The article addresses the provision and dissipation of power and electric current in wafer testing. It discusses improvements to the way power is supplied based on papers at the SouthWest Test Workshop. It describes a vertical probe card with added SmartClamp overcurrent protection. It analyzes the power supply-to-device under test electrical current path.

The article summarizes four research papers on the fidelity and integrity of high-speed signal within a device or on a printed circuit board (PCB). The first paper examined the relationship between a pair of traces carrying a differential signal and two vias carrying a different differential signal. Another paper studied the signal imbalance that ground-return has on nearby differential pairs of vias. A third paper investigated shared anti-pads and higher order modes of current propagation.

Discusses ultrawideband (UWB) technology testing. Procedures used for testing such technology; Developments in testing standards for ultrawideband devices; Technical considerations with UWB discussed in the report "Consultation Paper on the Introduction of Wireless Systems Using Ultrawideband Technology" published by Industry Canada.

The article offers information on the recently approved Association for Automated Identification and Mobility (AIM) Direct Part Mark (DPM) Quality Guideline DPM-1-2006, which is intended to handle a variety of marking techniques and part materials used in DPM applications. The metrics and methods that comprise the AIM DPM standard for assessing a mark's quality are discussed.

The article discusses whether scientists have developed a full-scale production memristor, a chip which is supposed to change its resistance according to its past electrical history and to work like a human brain's neurons. It focuses on the U.S. Defense Advanced Research Projects Agency's efforts to develop prototypes of memristor. It also refers to white papers from startup Knowm, founded by Alex Nugent, which claims to develop memristors with bidirectional incremental learning capability.

The article discusses the paper "NBMC Tackles Human Performance Monitoring, Medical Diagnostics," published within the issue.

The article presents a schedule of events related to engineering instrument manufacturers in 2006. Submission of formal papers and proposals for panels and the lecture or application series for the 2006 International Test Conference will be on February 17. Hobbs will hold environmental test-related seminars on March 20-21.

Presents news briefs concerning the electronic industry as of January 2005. Participation of Aeroflex in LXI Consortium; Selection of Agilent Technologies by STATS ChipPAC as its test supplier of semiconductor testing equipment; Schedule for receipt of session proposals and abstracts for technical papers for the AUTOTESTCON 2005.

Provides information on the 25th anniversary celebration of the EOS/ESD Symposium from September 21 to 25, 2003 in Las Vegas, Nevada sponsored by the ESD Association. Tutorials, paper sessions and interactive workshops to be conducted during the event; Product exhibition highlights; Registration fees for members and non-members.