1. Barrier-height determinations in thin-film tunnel junctions
- Author
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J.C. Cormier, A. Tosser, and P. Thureau
- Subjects
Range (particle radiation) ,Materials science ,Condensed matter physics ,business.industry ,Electrical engineering ,Dielectric permittivity ,Physics::Optics ,Condensed Matter::Materials Science ,Tunnel magnetoresistance ,Electric field ,Electrical and Electronic Engineering ,Thin film ,business ,Diode - Abstract
Using the previously determined value of the internal electric field of tunnel diodes, the authors use the electric tunnel method for the evaluation of metal-dielectric barrier heights. Effective mass of electron and dielectric permittivity are constant for a range of thickness from 50 to 150 A.
- Published
- 1966
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