7 results on '"Joan Figueras"'
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2. Signal integrity loss in bus lines due to open shielding defects.
3. LEAP: An accurate defect-free IDDQ estimator.
4. Analyzing the test generation problem for an application-oriented test of FPGAs.
5. Test configuration minimization for the logic cells of SRAM-based FPGAs: a case study.
6. On maximizing the coverage of catastrophic and parametric faults.
7. Low power BIST by filtering non-detecting vectors.
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