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Grain yield and yield components are the main important traits involved in durum wheat (Triticum turgidum L.) improvement programs. The purpose of this research was to identify quantitative trait loci (QTL) associated with yield components such as 1000 grain weight (TGW), grain weight per spike (GWS), number of grains per spike (GNS), spike number per m2 (SN), spike weight (SW), spike harvest index (SHI) and harvest index (HI) using microsatellite markers. Populations of F3 and F4 lines derived from 151 F2 individuals developed from a cross between Oste-Gata, a drought tolerant, and Massara-1, a drought susceptible durum wheat genotypes, were used. The populations were evaluated under four environmental conditions including two irrigation regimes of drought stress at terminal growth stages and normal field conditions in two growing seasons. Two hundred microsatellite markers reported for A and B genomes of bread wheat were used for parental polymorphism analysis and 30 polymorphic markers were applied to genotype 151 F2:3 families. QTL analysis was performed using genome-wide single marker regression analysis (SMA) and composite interval mapping (CIM). The results of SMA revealed that about 20% of the phenotypic variation of harvest index and TGW could be explained by Xcfd22-7B and Xcfa2114-6A markers in different environmental conditions. Similarly, Xgwm181-3B, Xwmc405-7B and Xgwm148-3B and marker Xwmc166-7B were found to be associated with SHI and GWS, respectively. A total of 20 minor and major QTL were detected; five for TGW, two for GWS, two for GNS, three for SN, five for HI, two for SHI and one for SW. The mapped QTL associated with ten markers. Moreover, some of these QTL were prominent and stable under drought stress and non drought stress environments and explained up to 49.5% of the phenotypic variation.