7 results on '"Franco, Jacopo"'
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2. Hot-Carrier Degradation Modeling of Decananometer nMOSFETs Using the Drift-Diffusion Approach
3. Intrinsic Robustness of TFET Subthreshold Swing to Interface and Oxide Traps: A Comparative PBTI Study of InGaAs TFETs and MOSFETs
4. Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON nMOSFETs
5. Extraction of the Random Component of Time-Dependent Variability Using Matched Pairs
6. Defect-Centric Distribution of Channel Hot Carrier Degradation in Nano-MOSFETs
7. Impact of Individual Charged Gate-Oxide Defects on the Entire $I_{D}$–$V_{G}$ Characteristic of Nanoscaled FETs
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