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Recently, integrating ferroelectric materials with nanotransistors such as carbon nanotube field-effect transistors (CNTFETs) has opened new doors for demonstrating a new generation of ultra-miniature circuits and systems. Utilizing the negative differential resistance effect in negative capacitance CNTFETs (NC-CNTFETs) has spurred the efforts for designing ultra-compact ternary circuits and systems similar to their binary structures. This paper presents an ultra-efficient ternary image edge detection hardware using NC-CNTFET technology. The proposed hardware is endowed with a noise reduction circuitry to mitigate the noise effects. Using four $1\times 3$ kernels and concatenating the image pixels, the proposed ternary hardware has been designed using only 50 transistors. The proposed ternary hardware at the circuit level shows, on average, 74% improvements regarding power delay-product (PDP) compared to the CNTFET-based counterparts. Our comprehensive simulations indicate that the proposed NC-CNTFET-based hardware shows a 40% improvement in data loss, 2.2 times improvement in performance ratio, and 1.14 times improvement in Pratt’s figure-of-merit, respectively, compared to the related designs. Our results accentuate that the proposed NC-CNTFET-based ternary hardware is a breakthrough achievement in demonstrating ultra-efficient and noise-immune ternary image processing circuits beyond the conventional binary counterparts. [ABSTRACT FROM AUTHOR]

In the above article , Fig. 5(b) belonged to another circuit (the Fe-CNTFET-based 2-transistor Schmitt trigger binary inverter, which is similar in the schematic to the circuit shown in Fig. 5 (a) of the above artice but with different flat band voltages), which was inserted in the revised version of the article by an unintentional mistake. The load line analysis of the circuit shown in Fig. 5 (a) of the article is shown in. For more clarity, the load line analysis has been plotted with more detail for Vin = 0.3V to 0.5V to indicate the performance of the ternary inverter in logic “1,” which matches the related VTC curve (Fig. 5 (c) shown in reference). [ABSTRACT FROM AUTHOR]