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6. PROTON: Post-Synthesis Ferroelectric Thickness Optimization for NCFET Circuits

7. Machine Learning for On-the-Fly Reliability-Aware Cell Library Characterization

8. On the Resiliency of NCFET Circuits Against Voltage Over-Scaling

9. Weight-Oriented Approximation for Energy-Efficient Neural Network Inference Accelerators

10. Modeling and Mitigating Time-Dependent Variability From the Physical Level to the Circuit Level

11. Automated Design Approximation to Overcome Circuit Aging

12. Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV