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Power module heat dissipation with spatial inhomogeneity and induced nonuniform temperature distribution presents a challenging concern for system reliability due to thermo-mechanical stresses. These reliability challenges are especially important for nonplanar designs using 3-D packaging principles. Here, we develop a heat spreader thermal switch capable of actively reducing temperature gradients between silicon carbide (SiC) devices in a three-level T-type power converter, which can change depending on electronic operating conditions. The heat spreader thermal switch consists of a stainless-steel (SS) heat spreader and a copper sliding switch embedded within the spreader. Heat transfer from the SiC devices and within the spreader can be controlled by moving the slider between positions within the spreader. To understand heat transfer mechanisms and design the heat spreader thermal switch, we conducted 3-D finite element method simulations to calculate the minimum attainable temperature difference between SiC devices. We used the finite element simulation to quantify the reduction in junction temperature swing during dynamic operation and coupled the results to the Coffin–Manson reliability model to quantify lifetime to failure. We integrated the heat spreader thermal switch with one phase of a three-phase T-type converter and demonstrated isothermalization at different working conditions. At 2.4-kW converter power, each hot SiC device dissipated 4.7 W of heat, resulting in a device case temperature of 43 °C, with each cold SiC device dissipating 1.7 W at 38 °C. The device-to-device temperature difference was decreased from 5 °C to 0 °C by moving the switch a distance of 20 mm. Finite volume method (FVM) simulations of the conjugate heat transfer problem validate the experimental results and support analysis of key performance parameters. This work demonstrates successful isothermalization of a power converter with an active heat spreader thermal switch and develops simulation and design guidelines for successful electro-thermal codesign and implementation of thermal switches for other electronics applications for which isothermalization and enhanced device reliability is a key issue. [ABSTRACT FROM AUTHOR]

A new design of stripline transition structures and flip-chip interconnects for high-speed digital communication systems implemented in low-temperature cofired ceramic (LTCC) substrates is presented. Simplified fabrication, suitability for LTCC machining, suitability for integration with other components, and connection to integrated stripline or microstrip interconnects for LTCC multichip modules and system on package make this approach well suited for miniaturized, advanced broadband, and highly integrated multichip ceramic modules. The transition provides excellent signal integrity at high-speed digital data rates up to 28 Gbits/s. Full-wave simulations and experimental results demonstrate a cost-effective solution for a wide frequency range from dc to 30 GHz and beyond. Signal integrity and high-speed digital data rate performances are verified through eye diagram and time-domain reflectometry and time-domain transmissometry measurements over a 10-cm long stripline. [ABSTRACT FROM AUTHOR]

Thin-film microstrip transmission lines fabricated using a Ti adhesion layer followed by layered Cu, Pt, and Au films are measured to determine tradeoffs between manufacturability issues and microwave performance. Since Ti metal has approximately 25 times the resistance of Cu, and currents in a microstrip line flow mainly at the interface with the substrate where the Ti is located, there is the possibility of increased RF signal losses with this structure. It is found that Ti adhesion layers of $\le 200$ -nm thickness cause minimal loss through 40 GHz on DuPont 9K7 low-temperature cofired ceramic substrates, so there is no significant electrical penalty for employing a metal stackup optimized for mechanical durability. These measurements, together with analysis and simulations suggest this will hold in general as long as the thinner, higher resistance adhesion metal is well below one skin depth in thickness at the operating frequency. [ABSTRACT FROM PUBLISHER]