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In digital circuit designs, sequential components such as flip-flops are used to synchronize signal propagations. Logic computations are aligned at and thus isolated by flip-flop stages. Although this fully synchronous style can reduce design efforts significantly, it may affect circuit performance negatively, because sequential components can only introduce delays into signal propagations but never accelerate them. In this article, we propose a new timing model, VirtualSync+, in which signals, specially those along critical paths, are allowed to propagate through several sequential stages without flip-flops. Timing constraints are still satisfied at the boundary of the optimized circuit to maintain a consistent interface with existing designs. By removing clock-to-q delays and setup time requirements of flip-flops on critical paths, the performance of a circuit can be pushed even beyond the limit of traditional sequential designs. In addition, we further enhance the optimization with VirtualSync+ by fine-tuning with commercial design tools, e.g., design compiler from Synopsys, to achieve more accurate result. To achieve this fine-tuning, we first optimize the circuits by reallocating sequential components with sequential and combinational components as delay units. Afterward, the removal locations of flip-flops with respect to the circuits under optimization are extracted and the corresponding wave-pipelining timing constraints compatible with commercial design tools are established. These timing constraints are then incorporated into the optimization flow of commercial tools to generate the optimized circuits. The experimental results demonstrate that circuit performance can be improved by up to 4% (average 1.5%) compared with that after extreme retiming and sizing, while the increase of area is still negligible. This timing performance is enhanced beyond the limit of traditional sequential designs. It also demonstrates that compared with those after retiming and sizing, the circuits with VirtualSync+ can achieve better timing performance under the same area cost or smaller area cost under the same clock period, respectively. [ABSTRACT FROM AUTHOR]

With recent advances in reverse engineering, attackers can reconstruct a netlist to counterfeit chips by opening the die and scanning all layers of authentic chips. This relatively easy counterfeiting is made possible by the use of the standard simple clocking scheme, where all combinational blocks function within one clock period, so that a netlist of combinational logic gates and flip-flops is sufficient to duplicate a design. In this article, we propose to invalidate the assumption that a netlist completely represents the function of a circuit with unconventional timing. With the introduced wave-pipelining (WP) paths, attackers have to capture gate and interconnect delays during reverse engineering, or to test a huge number of combinational paths to identify the WP paths. To hinder the test-based attack, we construct false paths with WP to increase the counterfeiting challenge. The experimental results confirm that WP true paths and false paths can be constructed in benchmark circuits successfully with only a negligible cost, thus thwarting the potential attack techniques. [ABSTRACT FROM AUTHOR]

At nanometer manufacturing technology nodes, process variations affect circuit performance significantly. This trend leads to a large timing margin and thus overdesign in the traditional worst-case circuit design flow. To combat this pessimism, post-silicon clock tuning buffers can be deployed to balance timing slacks of consecutive combinational paths in individual chips by tuning clock skews after manufacturing. A challenge of this method is that path delays of each chip with timing failures should be measured to gather the information for clock skew configuration. However, current methods for delay measurement rely on path-wise frequency stepping, which requires much time from expensive testers. In this paper, we propose an efficient delay test framework (EffiTest2) to solve the post-silicon testing problem by testing only representative paths with delay alignment using the already-existing tunable buffers in the circuit. Experimental results demonstrate that EffiTest2 can reduce the number of frequency stepping iterations by more than 94% with only a slight yield loss. [ABSTRACT FROM AUTHOR]

At submicrometer manufacturing technology nodes, process variations affect circuit performance significantly. To counter these variations, engineers are reserving more timing margin to maintain yield, leading to an unaffordable overdesign. Most of these margins, however, are wasted after manufacturing, because process variations cause only some chips to be really slow, while other chips can easily meet given timing specifications. To reduce this pessimism, we can reserve less timing margin and tune failed chips after manufacturing with clock buffers to make them meet timing specifications. With this post-silicon clock tuning, critical paths can be balanced with neighboring paths in each chip specifically to counter the effect of process variations. Consequently, chips with timing failures can be rescued and the yield can thus be improved. This is specially useful in high-performance designs, e.g., high-end CPUs, where clock binning makes chips with higher performance much more profitable. In this paper, we propose a method to determine where to insert post-silicon tuning buffers during the design phase to improve the overall profit with clock binning. This method learns the buffer locations with a Sobol sequence iteratively and reduces the buffer ranges afterward with tuning concentration and buffer grouping. Experimental results demonstrate that the proposed method can achieve a profit improvement of about 14% on average and up to 26%, with only a small number of tuning buffers inserted into the circuit. [ABSTRACT FROM AUTHOR]

Post-silicon clock tuning elements are widely used in high-performance designs to mitigate the effects of process variations and aging. Located on clock paths to flip-flops, these tuning elements can be configured through the scan chain so that clock skews to these flip-flops can be adjusted after manufacturing. Owing to the delay compensation across consecutive register stages enabled by the clock tuning elements, higher yield and enhanced robustness can be achieved. These benefits are, nonetheless, attained by increasing die area due to the inserted clock tuning elements. For balancing performance improvement and area cost, an efficient timing analysis algorithm is needed to evaluate the performance of such a circuit. So far this evaluation is only possible by Monte Carlo simulation which is very time-consuming. In this paper, we propose an alternative method using graph transformation, which computes a parametric minimum clock period and is more than 10^ 4 times faster than Monte Carlo simulation while maintaining a good accuracy. This method also identifies the gates that are critical to circuit performance, so that a fast analysis-optimization flow becomes possible. [ABSTRACT FROM AUTHOR]

Level-sensitive latches are widely used in high-performance designs. For such circuits, efficient statistical timing analysis algorithms are needed to take increasing process variations into account. The existing methods for solving this problem are still computationally expensive and can only provide the yield at a given clock period. In this paper, we propose a method combining reduced iterations and graph transformations. The reduced iterations extract setup time constraints and identify a subgraph for the following graph transformations handling the constraints from nonpositive loops. The combined algorithms are very efficient, more than ten times faster than other existing methods, and result in a parametric minimum clock period, which, together with the hold-time constraints, can be used to compute the yield at any given clock period very easily. [ABSTRACT FROM AUTHOR]