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When built-in test generation is used for a design that can be partitioned into logic blocks, it is advantageous to identify groups of blocks whose tests have similar characteristics, and use the same built-in test generation logic for the blocks in each group. This paper studies this issue for a built-in test generation method that produces functional broadside tests. Functional broadside tests are important for addressing overtesting of delay faults as well as avoiding excessive power dissipation during test application. The paper discusses the design of the test generation logic for a group of logic blocks, and the selection of the groups. [ABSTRACT FROM PUBLISHER]

Extensive research efforts are being carried out to evaluate and improve the reliability of computing devices either through beam experiments or simulation-based fault injection. Unfortunately, it is still largely unclear to which extend fault injection can provide an accurate error rate estimation at early stages and if beam experiments can be used to identify the weakest resources in a device. The importance and challenges associated with a timely, but yet realistic reliability evaluation grow with the increase of complexity in both the hardware domain, with the integration of different types of cores in an SoC (System-on-Chip), and the software domain, with the OS (operating system) required to take full advantage of the available resources. In this paper, we combine and analyze data gathered with extensive beam experiments (on the final physical CPU hardware) and microarchitectural fault injections (on early microarchitectural CPU models). We target a standalone Arm Cortex-A5 CPU and an Arm Cortex-A9 CPU integrated into an SoC and evaluate their reliability in bare-metal and Linux-based configurations. Combining experimental data that covers more than 18 million years of device time with the result of more than 176,000 injections we find that both the SoC integration and the presence of the OS increase the system DUEs (Detected Unrecoverable Errors) rate (for different reasons) but do not significantly impact the SDCs (Silent Data Corruptions) rate which is solely attributed to the CPU core. Our reliability analysis demonstrates that even considering SoC integration and OS inclusion, early, pre-silicon microarchitecture-level fault injection delivers accurate SDC rates estimations and lower bounds for the DUE rates. [ABSTRACT FROM AUTHOR]

Shamir's secret sharing scheme is an effective way to distribute secret to a group of shareholders. The security of the unprotected sharing scheme, however, can be easily broken by cheaters or attackers who maliciously feed incorrect shares during the secret recovery stage or inject faults into hardware computing the secret. In this paper, we propose cheater detection and identification schemes based on robust and algebraic manipulation detection (AMD) codes and m-disjunct matrices (superimposed codes). We present the constructions of codes for cheater detection and identification and describe how the cheater identification problem can be related to the classic group testing algorithms based on m-disjunct matrices. Simulation and synthesis results show that the proposed architecture can improve the security level significantly even under strong cheating attack models with reasonable area and timing overheads. [ABSTRACT FROM PUBLISHER]

In modern SoCs embedded memories should be protected by ECC against field failures to achieve acceptable reliability. They should also be repaired after fabrication to achieve acceptable fabrication yield. In technologies affected by high defect densities, conventional repair induces very high costs. To reduce it, we can use ECC-based repair, consisting in using the ECC for fixing words comprising a single faulty cell and self-repair to fix all other faulty words. However, as we show in this paper, for high defect densities the diagnosis circuitry required for ECC-based repair may induce very large hardware cost. To fix this issue, we introduce a new family of memory test algorithms that exhibit a property we termed as “single-read double-fault detection”. This approach gains interest in ultimate CMOS and post-CMOS technologies, where the defect densities are expected to increase significantly, and/or in very-low power design, as very-low voltage sharply increases defect densities. [ABSTRACT FROM PUBLISHER]

The Toggle-based X-masking method requires a single toggle at a given cycle, there is a chance that non-X values are also masked. Hence, the non-X value over-masking problem may cause a fault coverage degradation. In this paper, a scan chain partitioning scheme is described to alleviate non-X bit over-masking problem arising from Toggle-based X-Masking method. The scan chain partitioning method finds a scan chain combination that gives the least toggling conflicts. The experimental results show that the amount of over-masked bits is significantly reduced, and it is further reduced when the proposed method is incorporated with X-canceling method. However, as the number of scan chain partitions increases, the control data for decoder increases. To reduce a control data overhead, this paper exploits a Huffman coding based data compression. Assuming two partitions, the size of control bits is even smaller than the conventional X -toggling method that uses only one decoder. In addition, selection rules of X-bits delivered to X-Canceling MISR are also proposed. With the selection rules, a significant test time increase can be prevented. [ABSTRACT FROM AUTHOR]

This paper describes a new characterization of broadside tests that measures the proximity to functional operation conditions during their functional clock cycles, where delay faults are detected. Proximity to functional operation conditions is important for avoiding overtesting of delay faults. The new characterization considers a test as piecewise-functional based on its scan-in state. For functional operation conditions, the scan-in state must be a reachable state (a state that the circuit can enter during functional operation). However, using only reachable states as scan-in states limits the fault coverage that can be achieved. In a piecewise-functional broadside test, the scan-in state can be partitioned into substates that are also substates of reachable states. The paper presents a definition that allows every broadside test to be characterized as piecewise-functional. It also describes procedures for characterization, and for modification of broadside test sets so as to ensure that they create closer-to-functional operation conditions. [ABSTRACT FROM AUTHOR]

Memristor-based memory technology, also referred to as resistive RAM (RRAM), is one of the emerging memory technologies potentially to replace conventional semiconductor memories such as SRAM, DRAM, and flash. Existing research on such novel circuits focuses mainly on the integration between CMOS and non-CMOS, fabrication techniques, and reliability improvement. However, research on (manufacturing) test for yield and quality improvement is still in its infancy stage. This paper presents fault analysis and modeling for open defects based on electrical simulation, introduces fault models, and proposes test approaches for RRAMs. The fault analysis reveals that unique faults occur in addition to some conventional memory faults, and the detection of such unique faults cannot be guaranteed with just the application of traditional march tests. The paper also presents a new Design-for-Testability (DfT) concept to facilitate the detection of the unique faults. Two DfT schemes are developed by exploiting the access time duration and supply voltage level of the RRAM cells, and their simulation results show that the fault coverage can be increased with minor circuit modification. As the fault behavior may vary due to process variations, the DfT schemes are extended to be programmable to track the changes and further improve the fault/defect coverage. [ABSTRACT FROM AUTHOR]

The local switching activity of scan-based tests is important due to the possibility that scan-based tests will result in excessive power dissipation in certain subcircuits even when the total power dissipation is acceptable. This paper focuses on the local switching activity during the fast functional capture cycles of functional broadside tests. This switching activity is guaranteed not to exceed the switching activity possible during functional operation. Therefore, with functional broadside tests it is possible to maximize the switching activity without causing excessive power dissipation. This is important for test quality since, in general, higher switching activity allows more delay defects to be detected. In addition, it allows smaller test sets to be obtained for delay faults. The paper defines a switching activity metric called the adjacent switching activity that captures the switching activity around the sites of detected transition faults, where additional switching activity is most likely to contribute to test quality. It compares the cases where the adjacent and the total switching activity of functional broadside tests for transition faults are maximized. The results demonstrate that the two objectives result in significantly different test sets. Moreover, better quality test sets are obtained by maximizing the adjacent switching activity. [ABSTRACT FROM AUTHOR]

Optimized and custom arithmetic circuits are widely used in embedded systems such as multimedia applications, cryptography systems, signal processing and console games. Debugging of arithmetic circuits is a challenge due to increasing complexity coupled with non-standard implementations. Existing algebraic rewriting techniques produce a remainder to indicate the presence of a potential bug. However, bug localization remains a major bottleneck. Simulation-based validation using random or constrained-random tests are not effective for complex arithmetic circuits due to bit-blasting. In this paper, we present an automated test generation and bug localization technique for debugging arithmetic circuits. This paper makes four important contributions. We propose an automated approach for generating directed tests by suitable assignments of input variables to make the remainder non-zero. The generated tests are guaranteed to activate bugs. We also propose an automatic bug fixing technique by utilizing the patterns of the remainder terms as well as by analyzing the regions activated by the generated tests to detect and correct the error(s). We also propose an efficient debugging algorithm that can handle multiple dependent as well as independent bugs. Finally, our proposed framework, consisting of directed test generation, bug localization and bug correction, is fully automated. In other words, our framework is capable of producing a corrected implementation of arithmetic circuits without any manual intervention. Our experimental results demonstrate that the proposed approach can be used for automated debugging of large and complex arithmetic circuits. [ABSTRACT FROM AUTHOR]

Modern devices often include several embedded instruments, such as BIST interfaces, sensors, calibration facilities. New standards, such as IEEE Std 1687, provide vehicles to access these instruments. In approaches based on reconfigurable scan networks (RSNs), instruments are coupled with scan registers, connected into chains and interleaved with reconfigurable modules. Such modules embed reconfigurable multiplexers that permit a selective access to different parts of the chain. A similar scenario is also supported by IEEE Std 1149.1-2013. The test of permanent faults affecting an RSN requires to shift test vectors throughout a certain number of network configurations. This paper presents some methodologies to select the list of configurations that perform the complete test of the reconfigurable modules of the RSN. In particular, one method is presented that, by construction, can be proved to be able to apply the test in the minimum amount of clock cycles. Other methods are sub-optimal in terms of test application time (TAT), but scale well on large circuits. In order to provide a comparison between the proposed methods, experimental results on some benchmark RSNs are provided. [ABSTRACT FROM AUTHOR]

This paper describes a procedure that computes seeds for LFSR-based generation of partially-functional broadside tests. Existing LFSR-based test data compression methods compute seeds based on incompletely-specified test cubes. Functional broadside tests are fully-specified, and they have fully-specified scan-in states. This is the main challenge that the test generation procedure described in this paper needs to address. It addresses it by using a process that modifies an initial seed si in order to reduce the Hamming distance between the scan-in state pi that si creates and a reachable state rj . When the Hamming distance is reduced to zero, the seed can be used for generating functional broadside tests. When the distance is larger than zero, the tests are partially-functional. Experimental results are presented for transition faults in benchmark circuits to demonstrate the resulting distances and fault coverage. [ABSTRACT FROM AUTHOR]

Reliability is one of the most challenging problems in the context of three-dimensional network-on-chip (3D NoC) systems. Reliability analysis is prominent for early stages of the manufacturing process in order to prevent costly redesigns of a target system. This article classifies the potential physical faults of a baseline TSV-based 3D NoC architecture by targeting two-dimensional (2D) NoC components and their inter-die connections. In this paper, through-silicon via (TSV) issues, thermal concerns, and single event effect (SEE) are investigated and categorized, in order to propose evaluation metrics for inspecting the resiliency of 3D NoC designs. A reliability analysis for major source of faults is reported in this article separately based on their mean time to failure (MTTF). TSV failure probability induced by inductive and capacitive coupling is also discussed. Finally, the paper provides a formal reliability analysis on the aggregated faults that affect TSV. This formal analysis is critical for estimating the resiliency of different components in order to mitigate the redundancy cost of fault-tolerant design or to examine the efficiency of any proposed fault-tolerant methods for 3D NoC architectures. [ABSTRACT FROM PUBLISHER]

Existing low-power test generation procedures use a single number to represent the power dissipation in a circuit or subcircuit. As a result, the specific signal transitions they create may deviate substantially from those possible during functional operation (and those the circuit is designed for). Functional broadside tests create functional operation conditions during their two functional capture cycles. Therefore, the specific signal transitions that occur during their second, fast functional capture cycles can occur during functional operation. This paper defines and studies the patterns of signal transitions under the second, fast functional capture cycles of functional broadside tests. These patterns can be used for evaluating the deviations from functional power dissipation created by low-power test sets that consist of arbitrary (functional and nonfunctional) broadside tests. They can also be used for guiding the generation of low-power test sets. The paper presents experimental results for both applications. [ABSTRACT FROM AUTHOR]

Algebraic differential fault attack (ADFA) is an attack in which an attacker combines a differential fault attack and an algebraic technique to break a targeted cipher. In this paper, we present three attacks using three different algebraic techniques combined with a differential fault attack in the bit-flip fault model to break the SIMON block cipher. First, we introduce a new analytic method which is based on a differential trail between the correct and faulty ciphertexts. This method is able to recover the entire master key of any member of the SIMON family by injecting faults into a single round of the cipher. In our second attack, we present a simplified Gröbner basis algorithm to solve the faulty system. We show that this method could totally break SIMON ciphers with only 3 to 5 faults injected. Our third attack combines a fault attack with a modern SAT solver. By guessing some key bits and with only a single fault injected at the round $T - 6$T-6, where $T$T is the number of rounds of a SIMON cipher, this combined attack could manage to recover a master key of the cipher. For the last two attacks, we perform experiments to demonstrate the effectiveness of our attacks. These experiments are implemented on personal computers and run in very reasonable timing. [ABSTRACT FROM AUTHOR]

Triple Modular Redundancy (TMR) is a historical and long-time–used approach for masking various kinds of faults. By employing redundancy and analyzing the results of three separate executions of the same program, TMR is able to attain excellent levels of reliability. While TMR provides a desirable level of reliability, it suffers from the high power consumption of the redundant hardware, a severe detriment to its broad adoption. The energy consumption of TMR can be mitigated if its operations are divided into two stages, and one stage is dropped in the absence of fault. Such an approach, which is evaluated in recent research, however, quickly fails in the presence of permanent faults, as we show in this paper. In this work, we introduce Reactive TMR, a novel energy-efficient approach for tolerating both transient and permanent faults. The key idea is to detect and deactivate faulty components and re-assign their tasks to functioning ones. Using a combination of static scheduling and dynamic task-management, our method decouples tasks from cores that are susceptible to result in a faulty execution; hence, it instinctively tolerates permanent faults and improves both reliability and energy-efficiency. Through a detailed evaluation, we show that our proposal reduces the energy consumption of baseline TMR by 30 percent while preserving its reliability. As compared to the state-of-the-art proposal for TMR, our method, while maintaining the energy consumption, augments hard-fault–tolerance to the system. [ABSTRACT FROM AUTHOR]

Given a chip that produced a faulty output response to a test set, a defect diagnosis procedure produces a set of candidate faults that is expected to identify the defects that are present in the chip. The accuracy of the set of candidate faults is higher when the set is smaller or when its overlap with the defects that are present in the chip is larger. To increase the accuracy of a set of candidate faults, this paper describes an approach where several sets of candidate faults are computed based on different subsets of the test set. The subsets are obtained by removing small numbers of tests from the complete test set. The result is sets of candidate faults that are similar but not identical. The number of sets where a fault appears yields a confidence level that the fault actually belongs in a set of candidate faults. New sets of candidate faults are defined based on the confidence levels obtained. The smallest set of candidate faults can be used as the final result of defect diagnosis, or the sets can be used for ranking the candidates. Experimental results for benchmark circuits demonstrate the effectiveness of this approach. [ABSTRACT FROM PUBLISHER]

Scaling supply voltage to values near the threshold voltage allows a dramatic decrease in the power consumption of processors; however, the lower the voltage, the higher the sensitivity to process variation, and, hence, the lower the reliability. Large SRAM structures, like the last-level cache (LLC), are extremely vulnerable to process variation because they are aggressively sized to satisfy high density requirements. In this paper, we propose Concertina, an LLC designed to enable reliable operation at low voltages with conventional SRAM cells. Based on the observation that for many applications the LLC contains large amounts of null data, Concertina compresses cache blocks in order that they can be allocated to cache entries with faulty cells, enabling use of 100 percent of the LLC capacity. To distribute blocks among cache entries, Concertina implements a compression- and fault-aware insertion/replacement policy that reduces the LLC miss rate. Concertina reaches the performance of an ideal system implementing an LLC that does not suffer from parameter variation with a modest storage overhead. Specifically, performance degrades by less than 2 percent, even when using small SRAM cells, which implies over 90 percent of cache entries having defective cells, and this represents a notable improvement on previously proposed techniques. [ABSTRACT FROM AUTHOR]

A restoration based static test compaction procedure removes unnecessary test vectors from a functional test sequence in order to reduce its length. To allow the procedure to reduce the storage requirements of the sequence further, this paper introduces a new approach where a single stored sequence is used for applying several different functional test sequences. Under this approach, the stored sequence is considered as two-dimensional arrays with different dimensions. Each array yields a different test sequence, which is a permutation of the stored sequence. When the permutations are effective in detecting target faults, an existing static test compaction procedure, with certain modifications, can reduce the length of the stored sequence, and rely on the application of the permutations to detect all the target faults. Simulation results show significant reductions in the input test data volume. The cost of increased numbers of clock cycles for test application can be utilized for increasing the fault coverage of non-target faults. [ABSTRACT FROM AUTHOR]

This paper presents a new method for diagnosing (detection and location) multiple faults in an application-dependent interconnect of a SRAM-based FPGA. For fault detection, the proposed technique retains the original interconnect configuration and modifies the function of the LUTs using the new LUT programming function 1-Bit Sum Function (1-BSF); in addition, it utilizes features such as branches in the nets as well as the primary (unused) IOs of the FPGAs. The proposed method detects all possible stuck-at and bridging faults of all cardinalities in a single configuration; fault detection requires 1 + log2k test configurations for multiple stuck-at location and 2 + 2log2k additional test configurations to locate more than one pair-wise bridging faults (where k denotes the maximum combinational depth of the FPGA circuit). Following detection, the locations of multiple faults are hierarchically identified using the walking-1 test set and an adaptive approach for the interconnect structure. Net ordering independence is accomplished by utilizing features such as the presence of paths of nets that are either disjoint or joint between the primary input and at least one primary output. As validated by simulation on benchmark circuits, the proposed method scales extremely well for different Virtex FPGA families; this results in a significant reduction in the number of configurations for diagnosing multiple faults. [ABSTRACT FROM AUTHOR]

This contribution is concerned with the question whether an adversary can automatically manipulate an unknown FPGA bitstream realizing a cryptographic primitive such that the underlying secret key is revealed. In general, if an attacker has full knowledge about the bitstream structure and can make changes to the target FPGA design, she can alter the bitstream leading to key recovery. However, this requires challenging reverse-engineering steps in practice. We argue that this is a major reason why bitstream fault injection attacks have been largely neglected in the past. In this paper, we show that malicious bitstream modifications are i) much easier to conduct than commonly assumed and ii) surprisingly powerful. We introduce a novel class of bitstream fault injection (BiFI) attacks which does not require any reverse-engineering. Our attacks can be automatically mounted without any detailed knowledge about either the bitstream format or the design of the crypto primitive which is being attacked. Bitstream encryption features do not necessarily prevent our attack if the integrity of the encrypted bitstream is not carefully checked. We have successfully verified the feasibility of our attacks in practice by considering several publicly available AES designs. As target platforms, we have conducted our experiments on Spartan-6 and Virtex-5 Xilinx FPGAs. [ABSTRACT FROM PUBLISHER]

This paper presents a new method for generating configurations for application-dependent testing of a SRAM-based FPGA interconnect. This method connects an activating input to multiple nets, thus generating activating test vectors for detecting stuck-at, open, and bridging faults. This arrangement permits a reduction in the number of redundant configurations, thus also achieving a reduction in test time for application-dependent testing at full fault coverage. As the underlying solution requires an exponential complexity, a heuristic algorithm that is polynomial and greedy in nature (based on sorting) is used for net selection in the configuration generation process. It is proved that this algorithm has an execution complexity of O(L^3 ) (where L is the number of LUTs in the design). The proposed method requires at most log2(M+2) configurations (where M denotes the number of activating inputs) as Walsh coding is employed. Moreover, it is scalable with respect to LUT inputs. Extensive logic-based simulation results are provided for ISCAS89 sequential benchmark designs implemented on Xilinx Virtex4 FPGAs; these results shows that the proposed method achieves a considerable reduction in the number of test configurations compared with methods found in the technical literature (on average, a reduction of 49.5 percent). [ABSTRACT FROM AUTHOR]

Redundancy repair is a commonly used technique for memory yield improvement. In order to ensure high repair rate and final product yield, it is necessary to develop a repair scheme for the coming three-dimensional (3D) architecture of stacked DRAM. According to the JEDEC mobile memory technology roadmap, the interface of 3D DRAM, including the Wide I/O and High-Bandwidth Memory (HBM), is mainly classified as channel-based memories. In this paper, we propose a built-off self-test (BOSR) scheme at the controller level for channel-based 3D memory to enhance final product yield after the bonding of a memory cube to its corresponding logic die. The logic die contains the Channel controller, in which the BOSR circuit resides. Experimental results show that the repair rate is high with higher cluster failure ratio due to the flexible algorithm we choose. The area overhead is low and it decreases significantly when the memory size or channel count increases. The performance penalty is also low due to the parallel execution of address comparison and repair. Moreover, the manufacture cost is lower than conventional DRAM architecture due to allocator-based redundancies. Finally, the proposed scheme can easily be applied to other channel-based 3D memories. [ABSTRACT FROM AUTHOR]

Reconfigurable systems are gaining an increasing interest in the domain of safety-critical applications, for example in the space and avionic domains. In fact, the capability of reconfiguring the system during run-time execution and the high computational power of modern Field Programmable Gate Arrays (FPGAs) make these devices suitable for intensive data processing tasks. Moreover, such systems must also guarantee the abilities of self-awareness, self-diagnosis and self-repair in order to cope with errors due to the harsh conditions typically existing in some environments. In this paper we propose a self-repairing method for partially and dynamically reconfigurable systems applied at a fine-grain granularity level. Our method is able to detect correct and recover errors using the run-time capabilities offered by modern SRAM-based FPGAs. Fault injection campaigns have been executed on a dynamically reconfigurable system embedding a number of benchmark circuits. Experimental results demonstrate that our method achieves full detection of single and multiple errors, while significantly improving the system availability with respect to traditional error detection and correction methods. [ABSTRACT FROM AUTHOR]

The t/k -diagnosis strategy can significantly enhance the system’s self-diagnosing capability at the expense of no more than k fault-free processors (vertices) being mistakenly diagnosed as faulty under the PMC model. It is a generalization of the precise and pessimistic diagnosis strategies of system-level diagnosis on multiprocessor systems. It can detect up to t faulty processors (vertices) which might include at most k misdiagnosed processors (vertices), where k is typically a small number. In the case k≥1 , to our knowledge, there is no known t/k -diagnosis algorithm for general regular networks. In this paper, we first propose a general t/k -diagnosis (k≥1 ) algorithm for some m -regular networks. These m -regular networks satisfying some conditions could establish the t/k -diagnosis algorithm, say t/k - G -DIAG , to determine the t/k -diagnosability. The complexity of this algorithm is only O(NlogN) (when N≥2m) or O(Nm) (when N<2m) where N is the number of vertices in the network. Second, we present a complete proof that the network G is actually t/k -diagnosable. Finally, we establish the t/k -diagnosability (1≤k≤3 ) of some regular networks, including an n -dimensional alternating group graph, an n -dimensional Split-Star Network, a ln -hypermesh and an (n,l) -star graph, which are well-known interconnection networks proposed for multiprocessor systems. [ABSTRACT FROM AUTHOR]

This paper presents a set of eight novel configurations for the design of single event soft error (SE) tolerant latches. Each latch uses a three-transistor building block called 1P-2N and its complementary block 2P-1N. It is shown that all proposed latches have better soft error rate (SER) performance as compared to the SE-tolerant latches reported till date. It is also shown that the proposed configurations provide a more relaxed tradeoff between SER and other specifications mainly delay, power dissipation and area. RTL implementation of a proposed latch is also shown to verify the behaviour subjected to the transient faults. The benefit of implementing a SE tolerant circuit in VHDL language is the feasibility to exhaustively check the immunity of the circuit against transient faults at every sensitive node by just writing simple boolean expressions of each element in the circuit. The proposed configurations and a few selected reported configurations have been also designed, laid out and post layout extracted in 90 nm CMOS logic technology. Post layout simulations have been performed on all proposed latch configurations with clock frequency of 500 MHz and performance comparison results are presented. [ABSTRACT FROM PUBLISHER]

Detecting the effects of transient faults is a key point in many processor-based safety-critical applications. This paper proposes to adopt the debug interface module existing today in several processors/controllers available on the market. In this way, we can achieve a good detection capability and small latency with respect to control flow errors, while the cost for adopting the proposed technique is rather limited and does not involve any change either in the processor hardware or in the application software. The method works even if the processor uses caches and we experimentally evaluated its characteristics demonstrating the advantages and showing the limitations on two pipelined processors. Experimental results performed by fault injection using different software applications demonstrate that the method is able to archieve high fault coverage (more than 95 percent in nearly all the considered cases) with a limited cost in terms of area and performance degradation. [ABSTRACT FROM PUBLISHER]

Scaling the CMOS devices deep into the nanorange reduces their reliability margins significantly. Consequently, accurately calculating the reliability of digital nanocircuits is becoming a necessity for investigating design alternatives to optimize the trade-offs between area-power-delay and reliability. However, accurate reliability calculation of large and highly connected circuits is complex and very time consuming. This paper proposes a progressive consensus-based algorithm for identifying the worst reliability input vectors and the associated critical logic gates. Improving the reliability of the critical gates helps circuit designers to effectively improve the circuit overall reliability while having a minimal impact on the traditional power-area-deal design parameters. The accuracy and efficiency of the algorithm can be tuned to fit a variety of applications. The algorithm scales well with circuit size, and is independent of the interconnect complexity and the logic depth. Extensive computational results show that the accuracy and the efficiency of the proposed algorithm are better than the most recent results reported in the literature. [ABSTRACT FROM PUBLISHER]

Scan tree architecture has been proposed to reduce the test application time of full scan chain by placing multiple scan cells in parallel. Most existing techniques rely on non-compact test pattern sets to construct the scan tree. However, they produce inefficient scan tree when highly compact test sets with few don't cares are used. In this paper, the depth of the scan tree based on approximate compatibility relation for completely specified test data set is analyzed probabilistically by modeling its construction as a vertex coloring problem. The upper bound of edges-per-vertex is computed and demonstrated to be a prime factor that limits the efficiency of scan tree construction based on both compatible and approximately compatible test data between two flip-flops. Inverse compatibility and aggressive approximate compatibility are then proposed to increase the edges-per-vertex for vertex coloring. The Q′-SD connection between two adjacent scan cells is exploited to implement the inverse compatibility with no cost or timing impact. To maintain the fault coverage, the missing faults under the tree scan mode can be detected by switching the same base architecture into the linear scan mode with negligible hardware overhead as shown by the experimental results on ISCAS89, ISCAS99 and LGSynth93 benchmark circuits. On average, the scan tree generated by our method reduces the test time of the full scan chain by 56.65 percent, and that of the scan tree designed by the approximate compatibility method by 39.18 percent under the same compact test sets. [ABSTRACT FROM PUBLISHER]

Network-on-Chips (NoCs) are quickly becoming the standard communication paradigm for the growing number of cores on the chip. While NoCs can deliver sufficient bandwidth and enhance scalability, NoCs suffer from high power consumption due to the router microarchitecture and communication channels that facilitate inter-core communication. As technology keeps scaling down in the nanometer regime, unpredictable device behavior due to aging, infant mortality, design defects, soft errors, aggressive design, and process-voltage-temperature variations, will increase and will result in a significant increase in faults (both permanent and transient) and hardware failures. In this paper, we propose QORE—a fault tolerant NoC architecture with Multi-Function Channel (MFC) buffers. The use of MFC buffers and their associated control (link and fault controllers) enhance fault-tolerance by allowing the NoC to dynamically adapt to faults at the link level and reverse propagation direction to avoid faulty links. Additionally, MFC buffers reduce router power and improve performance by eliminating in-router buffering. We utilize a machine learning technique in our link controllers to predict the direction of traffic flow in order to more efficiently reverse links. Our simulation results using real benchmarks and synthetic traffic mixes show that QORE improves speedup by 1.3$\times$ and throughput by 2.3 $\times$ when compared to state-of-the art fault tolerant NoCs designs such as Ariadne and Vicis. Moreover, using Synopsys Design Compiler, we also show that network power in QORE is reduced by 21 percent with minimal control overhead. [ABSTRACT FROM PUBLISHER]

Test vector omission was introduced as a static test compaction procedure for functional test sequences. Experimental results indicated that it can also increase the fault coverage accidentally when it is applied to a sequence that does not detect all the detectable target faults. However, this capability was not explored directly. It is important since test vector omission provides a smaller search space for functional test sequences than any existing approach to sequential test generation. This paper describes a branch-and-bound procedure for test vector omission whose goal is to find functional test sequences for faults that are not detected by a given sequence. Experimental results for benchmark circuits demonstrate that the procedure provides a cost-effective addition to a simulation-based sequential test generation procedure. [ABSTRACT FROM PUBLISHER]

With the increased density of three-dimensional (3D) processor arrays, faults can potentially occur quite often due to power overheating during massively parallel computing. In order to achieve fault-tolerance under such a scenario, an effective way is to find an as large as possible logical fault-free subarray of m^\prime \;\times\; n^\prime \;\times\; h^\prime from a faulty array of m\;\times\; n\;\times\; h ( \;\le\; m,n^\prime \;\le\; n, h^\prime $\;\le\;$ $h$ ), such that an original application can still work on the m^\prime \;\times\; n^\prime \;\times\; h^\prime subarray. This paper investigates the problem of constructing maximum fault-free subarrays with minimum interconnection length from 3D arrays with faults. First, we prove that constructing maximum logical array (MLA) is NP-complete. We propose a linear-time algorithm which is capable of producing an MLA for the problem with the constraint of selected indexes. Second, we prove that minimizing the interconnection length (inter-length) of the MLA is NP-hard. We propose an efficient heuristic which significantly reduces the inter-length by revising each logical plane of the MLA. This leads to the reduction of communication cost, capacitance and dynamic power dissipation. In addition, we propose a lower bound for the inter-length of the MLA to evaluate the proposed algorithms. Simulation results show that, the size of logical array can be improved up to 62.6 percent in average, and the inter-length redundancy can be reduced by 22.7 percent in average, compared to the state-of-the-art, for all cases considered. [ABSTRACT FROM AUTHOR]

The application of single input change (SIC) pairs of test patterns is very efficient for sequential, i.e. stuck-open and delay fault testing. In this paper a novel implementation for the application of SIC pairs is presented and a formal proof of its completeness is provided. The presented generator is optimal in time, in the sense that it generates the n-bit SIC pairs in time \text n\times 2^n , i.e. equal to the theoretical minimum. Comparisons with the schemes that have been proposed in the open literature that generate SIC pairs in optimal time, reveal that the proposed scheme requires less hardware overhead. [ABSTRACT FROM AUTHOR]

The notion of Architectural Vulnerability Factor (AVF) has been extensively used to evaluate various aspects of design robustness. While AVF has been a very popular way of assessing element resiliency, its calculation requires rigorous and extremely time-consuming experiments. Furthermore, recent radiation studies in 90 nm and 65 nm technology nodes demonstrate that up to 55 percent of Single Event Upsets (SEUs) result in Multiple Bit Upsets (MBUs), and thus the Single Bit Flip (SBF) model employed in computing AVF needs to be reassessed. In this paper, we present a method for calculating the vulnerability of modern microprocessors -using Statistical Fault Injection (SFI)- several orders of magnitude faster than traditional SFI techniques, while also using more realistic fault models which reflect the existence of MBUs. Our method partitions the design into various hierarchical levels and systematically performs incremental fault injections to generate vulnerability estimates. The presented method has been applied on an Intel microprocessor and an Alpha 21264 design, accelerating fault injection by 15×, on average, and reducing computational cost for investigating the effect of MBUs. Extensive experiments, focusing on the effect of MBUs in modern microprocessors, corroborate that the SBF model employed by current vulnerability estimation tools is not sufficient to accurately capture the increasing effect of MBUs in contemporary processes. [ABSTRACT FROM PUBLISHER]

As the sizes of CMOS devices rapidly scale deep into the nanometer range, the manufacture of nanocircuits will become extremely complex and will inevitably introduce more defects, including more transient faults that appear during operation. For this reason, accurately calculating the reliability of future designs will be extremely critical for nanocircuit designers as they investigate design alternatives to optimize the tradeoffs between area-power-delay and reliability. However, accurate calculation of the reliability of large and highly connected circuits is complex and very time consuming. This paper presents a complete solution for estimating logic circuit reliability bounds with high accuracy in reasonable time, even for very large and complex circuits. The solution combines a novel criticality scoring algorithm to rank the reliability of individual input vectors with a heuristic search to find the input vector having the lowest reliability. The solution scales well with circuit size, and is independent of the interconnect complexity or the logic depth. Extensive computational results show that the speed of our method is orders of magnitude faster than exact solutions provided by Bayesian network exact inferences, while maintaining identical or sufficiently close accuracy. [ABSTRACT FROM PUBLISHER]

Address scrambling and data inversion techniques are proposed for yield enhancement of NROM-based ROMs in this paper. Besides using the conventional fault replacement techniques, fault masking effects are also exploited to further improve the fabrication yield and reduce the amount of extra spare rows/columns. That is, we consider the logical effects of physical defects when the customer's code is to be programmed. A novel test and repair flow is also proposed. Based on the proposed techniques, possibilities of fault masking can be maximized. A row/column scrambling control word and a control column are used for the control of the scrambling techniques and the data inversion technique, respectively. The problem for determining the control word can be modeled with a bipartite graph. The proposed test and repair techniques can be easily incorporated into the ROM BIST architectures. This makes the proposed techniques more practical to be integrated into current design flow. According to experimental results, the fabrication yield can be improved significantly. Moreover, the incurred hardware overhead and timing penalty are almost negligible. [ABSTRACT FROM PUBLISHER]

The Resistive Random Access Memory (RRAM) is a new type of non-volatile memory based on the resistive memory device. Researchers are currently moving from resistive device development to memory circuit design and implementation, hoping to fabricate memory chips that can be deployed in the market in the near future. However, so far the low manufacturing yield is still a major issue. In this paper, we propose defect and fault models specific to RRAM, i.e., the Over-Forming (OF) defect and the Read-One-Disturb (R1D) fault. We then propose a March algorithm to cover these defects and faults in addition to the conventional RAM faults, which is called March C*. We also develop a novel squeeze-search scheme to identify the OF defect, which leads to the Stuck-At Fault (SAF). The proposed test algorithm is applied to a first-cut 4-Mb HfO2-based RRAM test chip. Results show that OF defects and R1D faults do exist in the RRAM chip. We also identify specific failure patterns from the test results, which are shown to be induced by multiple short defects between bit-lines. By identifying the defects and faults, designers and process engineers can improve the RRAM yield in a more cost-effective way. [ABSTRACT FROM AUTHOR]

When complex functions, for example, substitution boxes of block ciphers, are realized in hardware, timing attributes of the underlying combinational circuit depend on the input/output changes of the function. These characteristics can be exploited by the help of a relatively new scheme called fault sensitivity analysis. A collision timing attack which exploits the data-dependent timing characteristics of combinational circuits is demonstrated in this paper. The attack is based on an also recently published correlation collision attack, which avoids the need for a hypothetical timing model for the underlying combinational circuit to recover the secret materials. The target platforms of our proposed attack are 14 AES ASIC cores of the SASEBO LSI chips in three different process technologies, 13 nm, 90 nm, and 65 nm. Successfully breaking all cores including the DPA-protected and fault attack protected cores indicates the strength of the attack. [ABSTRACT FROM AUTHOR]

Due to the increasing demand of an extra-low-power system, a great amount of research effort has been spent in the past to develop an effective and economic subthreshold SRAM design. However, the test methods regarding those newly developed subthreshold SRAM designs have not yet been fully discussed. In this paper, we first categorize the subthreshold SRAM designs into three types, study the faulty behavior of open defects and address decoders faults on each type of designs, and then identify the faults which may not be covered by a traditional SRAM test method. We will also discuss the impact of open defects and threshold-voltage mismatch on sense amplifiers under subthreshold operations. A discussion about the temperature at test is also provided. [ABSTRACT FROM AUTHOR]

This paper presents low cost techniques for error detection and correction in Ternary Content Addressable Memories (TCAMs). The techniques exploit the inherent redundancy of TCAM cells to allow for protection at lower cost. A fault detection technique with the cost of parity but with about the half probability of silent data corruption is proposed. This technique is then applied at both horizontal and vertical dimensions of the TCAM array, and a low cost error correction scheme is derived. Last, another error correction scheme is proposed, which employs a SECDED ECC of the half complexity, by making use of the TCAM redundancy, without compromising single bit error correction. The proposed schemes come with minimal area, power, and critical path overheads, in comparison with standard schemes, and they are good alternatives for TCAM arrays protection. [ABSTRACT FROM AUTHOR]

This paper presents a novel test point insertion method for pseudorandom built-in self-test (BIST) to reduce the area overhead. The proposed method replaces dedicated flip-flops for driving control points by existing functional flip-flops. For each control point, candidate functional flip-flops are identified by using logic cone analysis that investigates the path inversion parity, logical distance, and reconvergence from each control point. Four types of new control point structures are introduced based on the logic cone analysis results to avoid degrading the testability. Experimental results indicate that the proposed method significantly reduces test point area overhead by replacing the dedicated flip-flops and achieves essentially the same fault coverage as conventional test point implementations using dedicated flip-flops driving the control points. [ABSTRACT FROM AUTHOR]

Multicycle (multipattern) scan-based tests contain multiple clock cycles between scan operations. Each such clock cycle defines a pattern of the test. Multipattern tests require fewer clock cycles for test application compared with single-pattern or two-pattern tests for the same target faults. In addition, this paper demonstrates that patterns appearing later in a test typically have lower switching activity than patterns appearing earlier in the test. Based on these observations, the paper presents a static test compaction procedure for multipattern tests that targets a reduction in switching activity while reducing the number of clock cycles required for test application. The procedure is based on an operation called test merging. Merging of a test pair causes the patterns from both tests to appear in a single test. By placing the patterns from a test with a high switching activity at the end of a merged test, their switching activity can be reduced. The proposed procedure combines the test merging procedure with a procedure that modifies a test set so as to reduce its switching activity. Through this procedure it takes advantage of the opportunities created by test merging to reduce the switching activity of patterns that appear later in a test. [ABSTRACT FROM AUTHOR]

This paper proposes four logic-chain bridging fault models, which involve one net in the combinational logic and the other net in the scan chain. Test results of logic-chain bridging faults, unlike existing scan chain fault models, depend on the previous scan inputs as well as primary inputs. A bridging pair extraction algorithm is proposed to quickly extract bridging pairs from the layout. The paper proposed two sets of structural reduction techniques so that runtime is very short. Experimental results on ISCAS benchmark circuits show that, on the average, logic-chain bridging faults can be diagnosed within an accuracy of four bridging pairs. The techniques are still applicable when there are only 10 failing patterns due to limited ATE failure memory. This paper demonstrates the feasibility to diagnose logic-chain bridging faults by software. [ABSTRACT FROM PUBLISHER]

The manufacturing process of STT-MRAM requires unique steps to fabricate and integrate magnetic tunnel junction (MTJ) devices which are data-storing elements. Thus, understanding the defects in MTJs and their faulty behaviors are paramount for developing high-quality test solutions. This article applies the advanced device-aware test to intermediate (IM) state defects in MTJ devices based on silicon measurements and circuit simulations. An IM state manifests itself as an abnormal third resistive state, which differs from the two bi-stable states of MTJ. We performed silicon measurements on MTJ devices with diameter ranging from 60nm to 120nm; the results show that the occurrence probability of IM state strongly depends on the switching direction, device size, and bias voltage. We demonstrate that the conventional resistor-based fault modeling and test approach fails to appropriately model and test such a defect. Therefore, device-aware test is applied. We first physically model the defect and incorporate it into a Verilog-A MTJ compact model and calibrate it with silicon data. Thereafter, this model is used for a systematic fault analysis based on circuit simulations to obtain accurate and realistic faults in a pre-defined fault space. Our simulation results show that an IM state defect leads to intermittent write transition faults. Finally, we propose and implement a device-aware test solution to detect the IM state defect. [ABSTRACT FROM AUTHOR]

Duplication with Comparison (DWC) is an effective software-level solution to improve the reliability of computing devices. However, it introduces performance and energy consumption overheads that could be unsuitable for high-performance computing or real-time safety-critical applications. In this article, we present Reduced-Precision Duplication with Comparison (RP-DWC) as a means to lower the overhead of DWC by executing the redundant copy in reduced precision. RP-DWC is particularly suitable for modern mixed-precision architectures, such as NVIDIA GPUs, that feature dedicated functional units for computing with programmable accuracy. We discuss the benefits and challenges associated with RP-DWC and show that the intrinsic difference between the mixed-precision copies allows for detecting most, but not all, errors. However, as the undetected faults are the ones that fall into the difference between precisions, they are the ones that produce a much smaller impact on the application output and, thus, might be tolerated. We investigate RP-DWC impact into fault detection, performance, and energy consumption on Volta GPUs. Through fault injection and beam experiment, using three microbenchmarks and four real applications, we show that RP-DWC achieves an excellent coverage (up to 86 percent) with minimal overheads (as low as 0.1 percent time and 24 percent energy consumption overhead). [ABSTRACT FROM AUTHOR]

This paper describes a fast procedure for identifying undetectable transition faults under functional broadside tests. By using reachable states as scan-in states, functional broadside tests avoid overtesting that may occur when scan-based tests are used for detecting delay faults. The proposed procedure is based only on logic simulation, and does not perform test generation of any type. In one of its variations, the procedure uses logic simulation of fully unspecified primary input vectors starting from a known initial state in order to identify a superset of broadside tests that covers all the functional broadside tests. It then uses this superset to identify undetectable transition faults. The procedure identifies large numbers of undetectable transition faults in certain benchmark circuits. [ABSTRACT FROM PUBLISHER]

The significance of redundant technologies for improving dependability and delay fault testability are growing. So, delay fault testing on two-rail logic circuits well known as a class of redundant technologies will become important. Two-rail logic circuits can be efficiently tested by noncodeword vector pairs. However, noncodeword vector pairs may sensitize some faults which affect neither normal operation nor strongly fault secure property of the two-rail logic circuits. It means that testing with noncodeword vector pairs may be overtesting. This paper presents a construction of robust path delay fault test sets for two-rail logic circuits. The proposed test sets do not lead to the overtesting. The amounts of test data for the proposed test sets are, on average, 28.2 percent less than those for the test sets, which are obtained by the existing construction for unate circuits and lead to the overtesting. [ABSTRACT FROM AUTHOR]

The radiation sensitivity of memory cells increases dramatically as CMOS manufacture technology scales down; therefore, the reliability of memories has become a challenge. 3D technology has gained attention for having several advantages compared to the 2D counterpart, such as high integration density, high performance, low power, and high communication speed. Although several studies are targeting 3D memories, the effects on reliability using this technology have received little attention. This work introduces Line Product Code (LPC), a modified product code-based Error Correction Code (ECC) that uses both Hamming and parity in both rows and columns to implement reliable 3D memories. We implemented two lightweight LPC-based decoding algorithms in interleaved (LPCa-I) and non-interleaved (LPCa) versions, which allowed us to analyze LPC through a set of simulation cases that considers four severity levels of error incidence. The experimental results showed the effectiveness of the LPC-based algorithms, reaching correction rates of up 2.3 times higher compared to other Hamming-based algorithms. [ABSTRACT FROM AUTHOR]

Network-on-chip (NoC) is commonly used in modern many-core systems due to their high bandwidth and flexibility. As the manufacturing process keeps scaling, the reliability challenge in NoCs increases as well. The error correction code (ECC) is widely adopted in error correction NoCs to improve the data correctness. At the same time, extra stages are introduced in the router pipeline to improve the error correction capability. As a result, conventional error correction routers suffer from high network latency. Motivated by this limitation, i.e., we remove the extra pipeline stages delicately introduced for error correction. We propose an error correction router, called error corrector and detector relocation router (ECDR2), whose architecture optimizes the pipeline flow of the router. As a result, it can achieve both low latency and high error correction.Experimental results show that, compared with the baseline design, ECDR2 obtains 13.67 and 39.4 percent less average latency under the uniform traffic pattern and Dedup benchmark, respectively, in an 8 × 8 mesh NoC. The circuit area of ECR is also 7.9 percent less than that of the baseline design under 45-nm technology. [ABSTRACT FROM AUTHOR]

By injecting faults, active physical attacks pose serious threats to cryptographic hardware where Concurrent Error Detection (CED) schemes are promising countermeasures. They are usually based on an Error-Detecting Code (EDC) which enables detecting certain injected faults depending on the specification of the underlying code. Here, we propose a methodology to enable correct, practical, and robust implementation of code-based CEDs. We show that straightforward hardware implementations of given code-based CEDs can suffer from severe vulnerabilities, not providing the desired protection level. In particular, propagation of faults into combinatorial logic is often ignored in security evaluation of these schemes. First, we formally define this detrimental effect and demonstrate its destructive impact. Second, we introduce an implementation strategy to limit the fault propagation effect. Third, in contrast to many other works where the fault coverage is the main focus, we present a detailed implementation strategy which can guarantee the detection of any fault covered by the underlying EDC. This holds for any time of the computation and any location in the circuit, both in data processing and control unit. In short, we provide practical guidelines how to construct efficient CED schemes with arbitrary EDCs to achieve the desired protection level. We practically evaluate the efficiency of our methodology by case studies covering different symmetric block ciphers and various linear EDCs. [ABSTRACT FROM AUTHOR]

With the complexity of nanoelectronic devices rapidly increasing, an efficient way to handle large number of embedded instruments became a necessity. The IEEE 1687 standard was introduced to provide flexibility in accessing and controlling such instrumentation through a reconfigurable scan chain. Nowadays, together with testing the system for defects that may affect the scan chains themselves, the diagnosis of such faults is also important. This article proposes a method for generating stimuli to precisely identify permanent high-level faults in a IEEE 1687 reconfigurable scan chain: the system is modeled as a finite state automaton where faults correspond to multiple incorrect transitions; then, a dynamic greedy algorithm is used to select a sequence of inputs able to distinguish between all possible faults. Experimental results on the widely-adopted ITC'02 and ITC'16 benchmark suites, as well as on synthetically generated circuits, clearly demonstrate the applicability and effectiveness of the proposed approach: generated sequences are two orders of magnitude shorter compared to previous methodologies, while the computational resources required remain acceptable even for larger benchmarks. [ABSTRACT FROM AUTHOR]