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In spite of the apparent simplicity of the system under study, compact modeling of complementary resistive switching (CRS) devices, i.e., two antiserially connected memristive structures, is by no means straightforward. This requires a deep understanding of the voltage drops occurring across the circuit elements and correct treatment of the so-called snapback (SB) effect typical of the breakdown process of a thin dielectric film in an MIS or a MIM structure. The SB effect fundamentally consists in a sudden reduction of the device resistance caused by the formation of a filamentary path spanning the insulator. Beyond this point, the filament widens keeping the voltage drop across its extremes constant. The consequence of disregarding this effect is clearly distinguishable in the simulated curves: progressive openings of the on-state windows for both positive and negative voltages instead of abrupt ones. In this paper, a modification is introduced in the original memdiode model for memristive devices in order to account for this remarkable feature. Ta2O5-based CRS devices are considered to demonstrate the suitability of our approach. [ABSTRACT FROM AUTHOR]

This paper investigates the impact of threshold switching (TS) selector characteristics on the one-selector one-resistor (1S1R) cross-point array performance. TS selector parameter requirements are extracted for 1 Mb array, considering 1S, 1R cell compatibility, read/write margin, and power consumption constraints. The SPICE simulation results show that the threshold voltage ( V\mathrm {\mathbf {th}} ) and the ON-state resistance ( Rs ) are important selector parameters. Low V\mathrm {\mathbf {th}} eliminates 1R disturb issue during the read operation, but this comes at the expense of losing full cell nonlinearity (NL) during the write operation. Increase of V\mathrm {\mathbf {th}} and Rs improves the full cell NL and alleviate read disturb issue. However, these reduce 1S1R read window and additional voltages are required for both read and write operations. Compared with selector with nonabrupt current-voltage ( $I$ – $V$ ) characteristics, the TS selector is more favorable for the low-voltage operation. Finally, different reported TS selectors are evaluated, and the improvement directions are suggested. [ABSTRACT FROM PUBLISHER]

A model of resistive random access memory (RRAM) cells aimed at providing an optimal programming/erase scheme in which the timing and biasing can be accurately optimized is proposed and implemented. To expedite technology development with an emphasis on ICs, a predictive model to capture the physical operation of every memory cell is needed. Although a number of compact RRAM models have been developed, this paper further considers the time-dependent reset process and the heat transfer in the conductive filaments. These phenomena are becoming critical in scaled memory cells and need to be carefully addressed. Due to the physical nature of the model, model parameters can be straightforwardly calibrated, relying on limited measurement data. The compact model is implemented using Verilog-A, and it is flexible for different circuit simulators. [ABSTRACT FROM PUBLISHER]

All resistive switching memory devices face a critical voltage-time dilemma, as they require fast write at moderate voltage together with disturb immunity at lower (read) voltage. In this paper, excellent voltage-time characteristics are demonstrated on a 90-nm CMOS-friendly W/Al2O3/TiW/Cu conductive-bridging memory cell. The switching voltage was evaluated in the large write pulsewidth range between 10 ns and 10 s, from which a very low slope of $\sim 75$ mV/decade was extracted. These characteristics allow, on the one hand, a fast switching (10 ns) at <3 V, and, on the other hand, excellent voltage-disturb immunity extrapolated to ±0.5 V for 10 years. Both constant-voltage-stress and read-endurance tests supported these predictions. By means of conductive-atomic-force microscopy tomography, the hourglass shape of the Cu filament was evidenced. Both the more distributed electrical field induced by this shape along the filament and the analysis of a charge-transfer (redox) reaction as rate-limiting mechanism in the switching process are discussed as the origins of this excellent disturb immunity. [ABSTRACT FROM AUTHOR]