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In the study of resistive random access memory using GeTeOx film as the switching layer, the device performed excellent property of bipolar resistive switching (BRS), which could be gradually transformed to the complementary resistive switching (CRS) by varying SET process current compliance. The conductive filament conduction mechanism of BRS could be verified by electrical characteristics and reliable data fitting. Through increasing current compliance of the SET process, CRS could be achieved due to higher activity of oxygen vacancies originated from the intensified thermal effect. This paper was beneficial to understand the switching mechanisms of BRS and CRS and provide a method to realize interconversion. Moreover, it was also a potential and promising device to be applied in the neurosynaptic biomimetic field. [ABSTRACT FROM AUTHOR]

A highly transparent resistive random access memory with a configuration of multilayer graphene (MLG)/ Dy2O3 /indium tin oxide (ITO) structure is demonstrated in this paper. The fabricated device is transparent, with 80% transmittance at 550 nm. The MLG/ Dy2O3 /ITO device shows unipolar resistance switching with a low operation current (<100~\muA) , low operation voltage (<1~V) , low power consumption (<100~\muW) , high resistance ratio (>10^4) , fast switching speed (<60~ns) , reliable data retention, and promising cycle endurance properties (>200~cycles) , which makes a step toward the realization of low-power transparent electronics for next-generation nonvolatile memory application. The MLG/ Dy2O3 /ITO device exhibited typical filamentary-conduction-type resistive random access memory behavior and no forming process is required. High resistance state (HRS) increases with a reduced device area while low resistance state (LRS) is insensitive to the device sizes. Moreover, Raman spectra obtained in pristine state, HRS, and LRS indicate that the lower power consumption of MLG/ Dy2O3 /ITO device is attributable to the formation of oxygen graphene layers. [ABSTRACT FROM AUTHOR]