4 results on '"Wen, Huiqing"'
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2. Low ON-State Resistance Normally-OFF AlGaN/GaN MIS-HEMTs With Partially Recessed Gate and ZrOₓ Charge Trapping Layer
3. Review of Pulse Test Setup for the Switching Characterization of GaN Power Devices.
4. Low ON-State Resistance Normally-OFF AlGaN/GaN MIS-HEMTs With Partially Recessed Gate and ZrO ₓ Charge Trapping Layer.
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