14 results on '"Hua, Mengyuan"'
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2. GaN Power Integration Technology and Its Future Prospects
3. GaN Power Integration Technology and Its Future Prospects
4. Gate-Bias Induced Threshold Voltage (V TH) Instability in P-N Junction/AlGaN/GaN HEMT
5. Demonstration of β-Ga2O3 Heterojunction Gate Field-Effect Rectifier
6. Hole-Induced Degradation in ${E}$ -Mode GaN MIS-FETs: Impact of Substrate Terminations
7. Investigation of Dynamic ${I}_{ \mathrm{\scriptscriptstyle OFF}}$ Under Switching Operation in Schottky-Type p-GaN Gate HEMTs
8. Reverse-Conducting Normally-OFF Double-Channel AlGaN/GaN Power Transistor With Interdigital Built-in Schottky Barrier Diode
9. Hole-Induced Degradation in E-Mode GaN MIS-FETs: Impact of Substrate Terminations.
10. Hole-Induced Threshold Voltage Shift Under Reverse-Bias Stress in E-Mode GaN MIS-FET
11. Performance and V TH Stability in E-Mode GaN Fully Recessed MIS-FETs and Partially Recessed MIS-HEMTs With LPCVD-SiN x /PECVD-SiN xGate Dielectric Stack
12. Revealing the Nitridation Effects on GaN Surface by First-Principles Calculation and X-Ray/Ultraviolet Photoemission Spectroscopy
13. Performance and VTH Stability in E-Mode GaN Fully Recessed MIS-FETs and Partially Recessed MIS-HEMTs With LPCVD-SiNx/PECVD-SiNx Gate Dielectric Stack.
14. Characterization of Leakage and Reliability of SiNx Gate Dielectric by Low-Pressure Chemical Vapor Deposition for GaN-based MIS-HEMTs
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