Author: "Bender, Hugo" / Journal: ieee transactions on electron devices - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "Bender, Hugo" Journal ieee transactions on electron devices

2 results on '"Bender, Hugo"'

1. Experimental determination of the maximum post-process annealing temperature for standard CMOS wafers

Author: Sedky, Sherif, Witvrouw, Ann, Bender, Hugo, and Baert, Kris
Subjects: Annealing -- Research, Complementary metal oxide semiconductors -- Research, Business, Electronics, Electronics and electrical industries
Abstract: Maximum post-process annealing temperature for standard 0.35 mu m CMOS wafers having aluminium based interconnections and tungsten plugs, is studied.
Published: 2001

2. TCAD Strain Calibration Versus Nanobeam Diffraction of Source/Drain Stressors for Ge MOSFETs

Author: Buhler, Rudolf Theoderich, primary, Eneman, Geert, additional, Favia, Paola, additional, Witters, Liesbeth Johanna, additional, Vincent, Benjamin, additional, Hikavyy, Andriy, additional, Loo, Roger, additional, Bender, Hugo, additional, Collaert, Nadine, additional, Simoen, Eddy, additional, Martino, Joao Antonio, additional, and Claeys, Cor, additional
Published: 2015
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