8 results on '"Tsai, Xin-Ying"'
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2. The Transition of Threshold Voltage Shift of Al2O3/Si3N4 AlGaN/GaN MIS-HEMTs Under Negative Gate Bias Stress From DC to AC
3. Investigation of Threshold Voltage and Drain Current Degradations in Si$_{\text{3}}$N$_{\text{4}}$/AlGaN/GaN MIS-HEMTs Under X-Ray Irradiation
4. Forming-Free HfO2-Based Resistive Random Access Memory by X-Ray Irradiation
5. Performance and Reliability Optimization of Supercritical-Nitridation-Treated AlGaN/GaN High-Electron-Mobility Transistors
6. Investigation of Threshold Voltage and Drain Current Degradations in Si3N4/AlGaN/GaN MIS-HEMTs Under X-Ray Irradiation
7. Forming-Free HfO2-Based Resistive Random Access Memory by X-Ray Irradiation
8. Analysis of Abnormal Current Rise Mechanism in GaN-MIS HEMT With Al 2 O 3 /Si 3 N 4 Gate Insulator Under Hot Switching.
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