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The main goal in group testing is to recover a small subset of defective items from a larger population while efficiently reducing the total number of (possibly noisy) required tests/measurements. Under the assumption that the input-output statistical relationship (i.e., channel law) is known to the recovery algorithm, the fundamental as well as the computational limits of the group testing problem are relatively better understood than when these statistical relationships are unknown. Practical considerations, however, render this assumption inapplicable, and “blind” recovery/estimation procedures, independent of the input-output statistics, are desired. In this paper, we analyze the fundamental limits of a general noisy group testing problem, when this relationship is unknown. Specifically, in the first part of this paper, we propose an efficient scheme, based on the idea of separate-decoding of items (where each item is recovered separately), for which we derive sufficient conditions on the number of tests required for exact recovery. The difficulty in obtaining these conditions stems from the fact that we allow the number of defective items to grow with the population size, which in turn requires delicate concentration analysis of certain probabilities. Furthermore, we show that in several scenarios, our proposed scheme achieves the same performance as that of the corresponding non-blind recovery algorithm (where the input-output statistics are known), implying that the proposed blind scheme is robust/universal. Finally, in the second part of this paper, we propose also an inefficient combinatorial-based scheme (or, “joint-decoding”), for which we derive similar sufficient conditions. [ABSTRACT FROM AUTHOR]

The basic goal of threshold group testing is to identify up to $d$ defective items among a population of $n$ items, where $d$ is usually much smaller than $n$. The outcome of a test on a subset of items is positive if the subset has at least $u$ defective items, negative if it has up to $\ell $ defective items, where $0 \leq \ell < u$ , and arbitrary otherwise. This is called threshold group testing. The parameter $g = u - \ell - 1$ is called the gap. In this paper, we focus on the case $g > 0$ , i.e., threshold group testing with a gap. Note that the results presented here are also applicable to the case $g = 0$ ; however, the results are not as efficient as those in related work. Currently, a few reported studies have investigated test designs and decoding algorithms for identifying defective items. Most of the previous studies have not been feasible because there are numerous constraints on their problem settings or the decoding complexities of their proposed schemes are relatively large. Therefore, it is compulsory to reduce the number of tests as well as the decoding complexity, i.e., the time for identifying the defective items, for achieving practical schemes. The work presented here makes five contributions. The first is a more accurate theorem for a non-adaptive algorithm for threshold group testing proposed by Chen and Fu. The second is an improvement in the construction of disjunct matrices, which are the main tools for tackling (threshold) group testing and other tasks such as constructing cover-free families or learning hidden graphs. Specifically, we present a better exact upper bound on the number of tests for disjunct matrices compared with that in related work. The third and fourth contributions are a reduced exact upper bound on the number of tests and a reduced asymptotic bound on the decoding time for identifying defective items in a noisy setting on test outcomes. The fifth contribution is a simulation on the number of tests of the resulting improvements for previous work and the proposed theorems. [ABSTRACT FROM AUTHOR]

In the classical non-adaptive group testing setup, pools of items are tested together, and the main goal of a recovery algorithm is to identify the complete defective set given the outcomes of different group tests. In contrast, the main goal of a non-defective subset recovery algorithm is to identify a subset of non-defective items given the test outcomes. In this paper, we present a suite of computationally efficient and analytically tractable non-defective subset recovery algorithms. By analyzing the probability of error of the algorithms, we obtain bounds on the number of tests required for non-defective subset recovery with arbitrarily small probability of error. Our analysis accounts for the impact of both the additive noise (false positives) and dilution noise (false negatives). By comparing with information theoretic lower bounds, we show that the upper bounds on the number of tests are orderwise tight up to a \log ^2K factor, where $K$ is the number of defective items. We also provide simulation results that compare the relative performance of the different algorithms and reveal insights into their practical utility. The proposed algorithms significantly outperform the straightforward approaches of testing items one-by-one, and of first identifying the defective set and then choosing the non-defective items from the complement set, in terms of the number of measurements required to ensure a given success rate. [ABSTRACT FROM PUBLISHER]