Author: "Navabi, Zainalabedin" / Journal: ieee transactions on instrumentation & measurement / Language: english / Search Limiters: Full Text - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "Navabi, Zainalabedin" Search Limiters Full Text Language english Journal ieee transactions on instrumentation & measurement

Author: Karimi, Farzin, Navabi, Zainalabedin, Meleis, Waleed M., and Lomnardi, Fabrizio
Subjects: Standard IC, Data compression -- Analysis, Data compression -- Usage, Semiconductor chips -- Testing, Integrated circuits -- Testing, Automatic testing equipment -- Research
Published: 2004

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