Author: "Navabi, Zainalabedin" / Journal: ieee transactions on instrumentation & measurement / Publication Year Range: Last 50 years / Search Limiters: Full Text - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Navabi, Zainalabedin"' showing total 1 results

Start Over Author "Navabi, Zainalabedin" Search Limiters Full Text Publication Year Range Last 50 years Journal ieee transactions on instrumentation & measurement

1 results on '"Navabi, Zainalabedin"'

1. Using data compression in automatic test equipment for system-on-chip testing

Author: Karimi, Farzin, Navabi, Zainalabedin, Meleis, Waleed M., and Lomnardi, Fabrizio
Subjects: Standard IC, Data compression -- Analysis, Data compression -- Usage, Semiconductor chips -- Testing, Integrated circuits -- Testing, Automatic testing equipment -- Research
Published: 2004

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