22 results on '"Buchner, S. P."'
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2. Application of a Focused, Pulsed X-Ray Beam to the Investigation of Single-Event Transients in Al0.3Ga0.7N/GaN HEMTs
3. Measurement and Analysis of Multiple Output Transient Propagation in BJT Analog Circuits
4. Validation of the Variable Depth Bragg Peak Method for Single-Event Latchup Testing Using Ion Beam Characterization
5. Modeling and Investigations on TID-ASETs Synergistic Effect in LM124 Operational Amplifier From Three Different Manufacturers
6. Investigation of Flip-Flop Effects in a Linear Analog Comparator-With-Hysteresis Circuit
7. Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing
8. Pulsed-Laser Testing for Single-Event Effects Investigations
9. Correlation of Laser Test Results With Heavy Ion Results for NAND Flash Memory
10. Development of a New Methodology to Model the Synergistic Effects Between TID and ASETs
11. Rate Predictions for Single-Event Effects--Critique II.
12. Laser Simulation of Single Event Upsets.
13. Dependence of the SEU window of vulnerability of a logic circuit on magnitude of deposited charge
14. Pulsed laser-induced SEU in integrated circuits: a practical method for hardness assurance testing
15. Modification of single event upset cross section of an SRAM at high frequencies
16. Charge-collection characteristics of GaAs heterostructure FETs fabricated with a low-temperature grown GaAs buffer layer
17. Single-event phenomena in GaAs devices and circuits
18. Laboratory tests for single-event effects
19. Pulsed laser-induced charge collection in GaAs MESFETs
20. Ion induced charge collection in GaAs MESFETs
21. Charge collection in GaAs MESFETs and MODFETs
22. Laser simulation of single-event upset in a p-well CMOS counter
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