5 results on '"Shi, Shuting"'
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2. Efficacy of Transistor Stacking on Flip-Flop SEU Performance at 22-nm FDSOI Node
3. Impact of CnRx Structure on Soft Error Rates of Flip-Flop Designs at 22-nm FD SOI Node
4. Microbeam Heavy-Ion Single-Event Effect on Xilinx 28-nm System on Chip
5. Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam
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