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Your search keyword '"Changyong Liu"' showing total 5 results
Start Over Author "Changyong Liu" Journal ieice electronics express
5 results on '"Changyong Liu"'

1. A single event upset tolerant latch with parallel nodes

Author

Chunyu Peng, Zhao Qiang, Li Xuan, Xuan Zeng, Changyong Liu, Zhiting Lin, Xiulong Wu, Liu Nianlong, Junning Chen, and Xiangdong Hu

Subjects
Single event upset, Computer science, business.industry, Embedded system, Electrical and Electronic Engineering, Condensed Matter Physics, business, Electronic, Optical and Magnetic Materials
Published
2019

2. An inverter chain with parallel output nodes for eliminating single-event transient pulse

Author

Chunyu Peng, Xiulong Wu, Xuan Zeng, Changyong Liu, Xiangdong Hu, Zhao Qiang, Junning Chen, Li Xuan, and Zhiting Lin

Subjects
Chain (algebraic topology), Control theory, Computer science, Event (relativity), Inverter, Transient (oscillation), Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Pulse (physics)
Published
2019

4. A dual-output hardening design of inverter chain for P-hit single-event transient pulse elimination

Author

Xiulong Wu, Chunyu Peng, Zhiting Lin, Xuan Zeng, Zhao Qiang, Changyong Liu, Xiangdong Hu, Ziyang Chen, Junning Chen, and Li Xuan

Subjects
010302 applied physics, Materials science, 010308 nuclear & particles physics, Control theory, 0103 physical sciences, Hardening (metallurgy), Inverter, Electrical and Electronic Engineering, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials
Published
2018

5. A radiation harden enhanced Quatro (RHEQ) SRAM cell

Author

Zhiting Lin, Chunyu Peng, Songsong Xiao, Changyong Liu, Xiulong Wu, Ziyang Chen, and Jingbo Zhang

Subjects
010302 applied physics, Engineering, 010308 nuclear & particles physics, business.industry, Sram cell, Radiation, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Single event upset, Embedded system, 0103 physical sciences, Static noise margin, Electrical and Electronic Engineering, business
Published
2017

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