1. Integrated design of run-to-run PID controller and SPC monitoring for process disturbance rejection.
- Author
-
Fugee Tsung and Jianjun Shi
- Subjects
INDUSTRIAL design ,PID controllers ,AUTOMATIC control systems ,PRODUCTION engineering ,MANUFACTURING processes ,INDUSTRIAL engineering - Abstract
An integrated design methodology has been developed for a run-to-run PID controller and SPC monitoring for the purpose of process disturbance rejection. In the paper, the process disturbance is assumed to be an ARMA (1.1) process. A detailed procedure is developed to design a PID controller which minimizes process variability. The performance of the PID controller is also discussed. A joint monitoring of input and output, using Bonferroni's approach, is then designed for the controlled process. The ARL performance is studied. One major contribution of the paper is to develop a complete procedure and design plots, which serve as tools to conduct all the aforementioned tasks. An example is provided to illustrate the integrated design approach. [ABSTRACT FROM AUTHOR]
- Published
- 1999
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