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3 results on '"HONGLEI XU"'

1. Numerical studies on sub-10 nanometer resolution imaging in electrostatic force microscopy

Author

Guocong Lin, Dihu Chen, Xidong Ding, Liangbing Zhao, and Honglei Xu

Subjects
Materials science, business.industry, Electrostatic force microscope, Resolution (electron density), 02 engineering and technology, Lateral resolution, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Finite element method, Electronic, Optical and Magnetic Materials, Optics, Control and Systems Engineering, 0103 physical sciences, Materials Chemistry, Ceramics and Composites, Nanometre, Electrical and Electronic Engineering, 010306 general physics, 0210 nano-technology, business, Boundary element method, Bimetallic strip
Abstract

The lateral resolutions of electrostatic force microscopy (EFM) are systematically simulated using the boundary element method, considering a bimetallic sample with surface potential inhomogeneitie...

Published
2017

2. Improving lateral resolution of ambient electrostatic force microscopy by intermittent contact method

Author

Guocong Lin, Xidong Ding, Honglei Xu, Dongzi Liu, and Dihu Chen

Subjects
Kelvin probe force microscope, Mesoscopic physics, Materials science, business.industry, Electrostatic force microscope, Work (physics), Resolution (electron density), 02 engineering and technology, Lateral resolution, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Electronic, Optical and Magnetic Materials, Optics, Control and Systems Engineering, 0103 physical sciences, Microscopy, Materials Chemistry, Ceramics and Composites, Electrical and Electronic Engineering, 010306 general physics, 0210 nano-technology, business, Nanoscopic scale
Abstract

Electrostatic force microscopy (EFM) including its derivative, Kelvin probe force microscopy, is widely used to investigate mesoscopic/nanoscopic conducting/semiconducting structures and electrical interactions. However, the resolution of EFM in ambient is largely limited by the applicable force-detection techniques. This work demonstrates that the lateral resolution of ambient EFM can be significantly improved using an intermittent contact method in conjunction with a resonant multi-frequency method for electrostatic force detection. A lateral resolution of sub-10 nm is obtained. The high-resolution contrast reflects the variation of surface potential in sample on a nanoscale. The mechanism, which is attributed to the decreased effective tip-sample distance, is elucidated by theoretical analysis. The newly developed technique can be easily integrated with existing techniques to herald the next generation of high-resolution probe techniques for various nanoscopic applications.

Published
2016

3. Improving lateral resolution of ambient electrostatic force microscopy by intermittent contact method.

Author

Dongzi Liu, Xidong Ding, Honglei Xu, Guocong Lin, and Dihu Chen

Subjects
ELECTROSTATICS, MESOSCOPIC systems, NANOFILMS, SURFACE potential, KELVIN probe force microscopy
Abstract

Electrostatic force microscopy (EFM) including its derivative, Kelvin probe force microscopy, is widely used to investigate mesoscopic/ nanoscopic conducting/semiconducting structures and electrical interactions. However, the resolution of EFM in ambient is largely limited by the applicable force-detection techniques. This work demonstrates that the lateral resolution of ambient EFM can be significantly improved using an intermittent contact method in conjunction with a resonant multi-frequency method for electrostatic force detection. A lateral resolution of sub-10 nm is obtained. The high-resolution contrast reflects the variation of surface potential in sample on a nanoscale. The mechanism, which is attributed to the decreased effective tip-sample distance, is elucidated by theoretical analysis. The newly developed technique can be easily integrated with existing techniques to herald the next generation of high-resolution probe techniques for various nanoscopic applications. [ABSTRACT FROM AUTHOR]

Published
2016
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