1. On the use of atomic force microscopy for structural mapping of metallic-glass thin films.
- Author
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Zeng, J.F., Chu, J.P., Chen, Y.C., Volland, A., Blandin, J.J., Gravier, S., and Yang, Y.
- Subjects
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METALLIC glasses , *ATOMIC force microscopy , *THIN films , *SINGLE crystals , *ENERGY dissipation , *COMPARATIVE studies - Abstract
Abstract: In this article, we discuss the recent use of the high-resolution dynamic atomic force microscopy (DAFM) in mapping the nano-scale dynamical structural heterogeneity in thin film metallic-glasses (TFMGs). Our focus is laid on the major factors which can influence the structural contrast in the DAFM images, such as tip radius, free-amplitude, set-point amplitude and surface roughness. Finally, through a comparative study of different TFMGs and single-crystal silicon, we demonstrate that the DAFM technique is effective in distinguishing different nanostructures through their energy dissipation spectra. [Copyright &y& Elsevier]
- Published
- 2014
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