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Disintegration theory is employed to present a new retention model of the single-electron memory, which is in a simple expression and includes most of the critical physical parameters. Based on this model, Fermi energy, work function, the quantum dot radius and the barrier of the material encapsulating the quantum dot have great effects on the stored electron lifetime. Finally, the relationships between the retention and dimensions, materials, quantum size effects of SEM are given in diagrams. [ABSTRACT FROM AUTHOR]

Unlike that in macro scale, adhesive force becomes a important factor in micro dimensions in the area of MEMS and NMES. Therefore, it is one of the key parameters that need measuring and modeling. A novel micro mechanical structure called " micro leverage" was presented to measure adhesive force. The value of the adhesive force between different surfaces can be simply obtained through the electrostatic voltage that balance the required adhesive force. The principle of "micro leverage" was discussed in details, and a novel process that we called alternative silicon dissolved process is used to fabricate the structure for the advantage of anti-sticking. At the end of the paper, the idea is demonstrated by testing results on gold-gold surfaces. [ABSTRACT FROM AUTHOR]

For the purpose of a high reliability and long lifetime micro relay, the failure modes and mechanisms of the relay were analyzed. Among them, two dominant failure modes are discussed. Stiction usually occurs during the structure release process and constrains the yields very much, while arcs between contact pads caused by voltage drops impose a vital issue on lifetime of the relay. Several release process was compared, as the results, SCC02 release is the best of all. Contact electrodes that were made of different metal were prepared and tested to weaken arc effects. [ABSTRACT FROM AUTHOR]