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The photothermal characteristics of semi-transparent medium are the basis for describing the transmission process of photothermal radiation. Therefore, the related measurement researches have important application value for the non-destructive testing of high-tech module. In the present work, an infrared thermal wave radar imaging (TWRI) technique combined with sequential quadratic programming (SQP) algorithm was proposed for simultaneous reconstruction of the photothermal property distributions in 2D semi-transparent materials containing defects. The Fourier transform, Hilbert transform, and the Chirp lock-in correlation algorithm were applied and the results of the amplitude and phase information of the temperature signals were compared, so as to identify the position of internal defects, which reduced the number of parameters needed to reconstruct. Then, the SQP algorithm was introduced to simultaneously reconstruct the absorption coefficient and thermal conductivity coefficient distributions in the medium. The TWRI-SQP technique absorbs the advantages of fast identification of defects by TWRI technique and the accurate reconstruction of the photothermal properties of the semi-transparent materials by SQP algorithm. The number of internal defects, geometric dimensioning, shape, and photothermal properties can be reconstructed accurately. The results show that this method is practical and robust to detect the photothermal properties of 2D semi-transparent materials with defects.