42 results on '"Linker G"'
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2. Rutherford Backscattering Analysis with Very High Depth Resolution Using an Electrostatic Analysing System
3. Application of a High-Resolution Magnetic Spectrometer to Near-Surface Materials Analysis
4. An Apparatus for the Study of Ion and Photon Emission from Ion Bombarded Surfaces: I. Some Preliminary Results
5. Versatile Apparatus for Real-Time Profiling of Interacting Thin Films Deposited in Situ
6. Studies of Tantalum Nitride Thin Film Resistors
7. Lithium Ion Backscattering as a Novel Tool for the Characterization of Oxidized Phases of Aluminum Obtained from Industrial Anodization Procedures
8. Investigation of an Amino Sugar-Like Compound from the Cell Walls of Bacteria Using Backscattering of MeV Particles
9. Backscattering and T.E.M. Studies of Grain Boundary Diffusion in Thin Metal Films
10. Interdiffusion Kinetics in Thin Film Couples
11. Depth Profiling of Implanted 3He in Solids by Nuclear Reaction and Rutherford Backscattering
12. The Analysis of Nickel and Chromium Migration Through Gold Layers
13. Applications of Ion Beam Analysis to Insulators
14. Analysis of Ga1-xAlxAs-GaAs Heteroepitaxial Layers by Proton Backscattering
15. Measurement of Thermal Diffusion Profiles of Gold Electrodes on Amorphous Semiconductor Devices by Deconvolution of Ion Backscattering Spectra
16. Ion Beam Analysis of Aluminium Profiles in Hetero-Epitaxial Ga1-xAlxAs-Layers
17. Investigation of CVD Tungsten Metallizations on Silicon by Backscattering
18. Ion Beam Studies of Thin Films and Interfacial Reactions
19. Enhanced Sensitivity of Oxygen Detection by The 3.05 MeV (α, α) Elastic Scattering
20. Pore Size from Resonant Charged Particle Backscattering
21. Studies of Surface Contaminations, Composition and Formation of Superconducting Layers of V, Nb3Sn and of Tunneling Elements Using High Energetic Protons Combined with Heavy Ions
22. On Problems of Resolving Power in Rutherford Backscattering
23. Some Practical Aspects of Depth Profiling Gases in Metals by Proton Backscattering: Application to Helium and Hydrogen Isotopes
24. Depth Profiling of Deuterium and Helium in Metals by Elastic Proton Scattering: A Measurement of the Enhancement of the Elastic Scattering Cross Section Over Rutherford Scattering Cross Section
25. Range Parameters of Heavy Ions in Silicon and Germanium with Reduced Energies from 0.001 ≤ ε ≤ 10
26. The Application of Low Angle Rutherford Backscattering to Surface Layer Analysis
27. Measurement of Projected and Lateral Range Parameters for Low Energy Heavy Ions in Silicon by Rutherford Backscattering
28. Near-Surface Investigation by Backscattering of N+Ions and Grazing Angle Beam Incidence
29. Determining Concentration vs. Depth Profiles from Backscattering Spectra without Using Energy Loss Values
30. Analyzing the Formation of a thin Compound Film by Taking Moments on Backscattering Spectra
31. Computer Analysis of Nuclear Backscattering
32. Comparative Analysis of Surface Layers by Backscattering and by Auger Electron Spectroscopy
33. Energy Spreading Calculations and Consequences
34. Energy Straggling of 4He Ions in Al and Cu in the Backscattering Geometry
35. Energy Dependence of Proton Straggling in Carbon
36. Determination of Stopping Cross Sections by Rutherford Backscattering
37. Energy Loss Straggling of Protons in Thick Absorbers
38. Evidence of Solid State Effects in the Energy Loss of 4He Ions in Matter
39. Analysis of Nuclear Scattering Cross Sections by Means of Molecular Ions
40. The Treatment of Energy-Loss Fluctuations in Surface-Layer Analysis by Ion Beams
41. Empirical Stopping Cross Sections for 4He Ions
42. Progress Report on the Backscattering Standards Project
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