18 results on '"Hussam Amrouch"'
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2. Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper).
3. Impact of Self-Heating in 5nm FinFETs at Cryogenic Temperatures for Reliable Quantum Computing: Device-Circuit Interaction.
4. Monolithic 3D Integrated BEOL Dual-Port Ferroelectric FET to Break the Tradeoff Between the Memory Window and the Ferroelectric Thickness.
5. Reliable FeFET-based Neuromorphic Computing through Joint Modeling of Cycle-to-Cycle Variability, Device-to-Device Variability, and Domain Stochasticity.
6. Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths.
7. Suppressing Channel Percolation in Ferroelectric FET for Reliable Neuromorphic Applications.
8. Ferroelectric FET Threshold Voltage Optimization for Reliable In-Memory Computing.
9. Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance FET.
10. Robust Brain-Inspired Computing: On the Reliability of Spiking Neural Network Using Emerging Non-Volatile Synapses.
11. Impact of Radiation on Negative Capacitance FinFET.
12. BTI and HCD Degradation in a Complete 32 × 64 bit SRAM Array - including Sense Amplifiers and Write Drivers - under Processor Activity.
13. Impact of Extrinsic Variation Sources on the Device-to-Device Variation in Ferroelectric FET.
14. Temperature Dependence and Temperature-Aware Sensing in Ferroelectric FET.
15. Impact of NBTI on Increasing the Susceptibility of FinFET to Radiation.
16. Cleaved-Gate Ferroelectric FET for Reliable Multi-Level Cell Storage.
17. Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.
18. Connecting the physical and application level towards grasping aging effects.
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