18 results on '"Stanislav Tyaginov"'
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2. Impact of gate stack processing on the hysteresis of 300 mm integrated WS2 FETs.
3. Statistical Characterization of Off-State Stress Degradation in Planar HKMG nFETs Using Device Arrays.
4. Bias Temperature Instability (BTI) of High-Voltage Devices for Memory Periphery.
5. Physics-based device aging modelling framework for accurate circuit reliability assessment.
6. A BSIM-Based Predictive Hot-Carrier Aging Compact Model.
7. The properties, effect and extraction of localized defect profiles from degraded FET characteristics.
8. The Influence of Gate Bias on the Anneal of Hot-Carrier Degradation.
9. A Compact Physics Analytical Model for Hot-Carrier Degradation.
10. Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures.
11. Modeling the Effect of Random Dopants on Hot-Carrier Degradation in FinFETs.
12. Full (Vg, Vd) Bias Space Modeling of Hot-Carrier Degradation in Nanowire FETs.
13. On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors.
14. Temperature Dependent Mismatch and Variability in a Cryo-CMOS Array with 30k Transistors.
15. Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors.
16. Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs.
17. Evaluating Forksheet FET Reliability Concerns by Experimental Comparison with Co-integrated Nanosheets.
18. Origins and implications of increased channel hot carrier variability in nFinFETs.
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