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2. Fabrication of Josephson junctions by single line etching of Nb thin films utilizing nitrogen-gas-field ion-source focused ion beam

4. Construction of a lattice constant in an epitaxial magnesium oxide film deposited on a silicon substrate

5. Investigation of in-plane anisotropy of c-axis magnetoresistance for BiCh2-based layered superconductor NdO0.7F0.3BiS2.

6. Three-dimensional microfluidic cell culture device that generates chemical and oxygen gradients

7. Constriction of a lattice constant in an epitaxial magnesium oxide film deposited on a silicon substrate

9. Structure-based capacitance modeling and power loss analysis for the latest high-performance slant field-plate trench MOSFET

10. Effects of On-Chip Decoupling Capacitor on Switching Noise and Radiated Emission

11. Piezoelectric Poly-L-Lactic Acid Film Prepared by a New Method

12. Testing Method to Determine the Influence of Dust Adhesion on Digital Versatile Disk

13. Microanalysis of Brownian Particles and Real-Time Nanometer Vibrometry with a Laser-Diode-Pumped Self-Mixing Thin-Slice Solid-State Laser

14. Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-Ray Diffraction Method with Sub-µm Spatial Resolution

15. New n-Type Thermoelectric Oxide, Cd3TeO6

17. Room-temperature electroluminescence from radial p–i–n InP/InAsP/InP nanowire heterostructures in the 1.5-µm-wavelength region

18. Preparation of Diamond-Like Carbon on Ti Film with Tetramethylsilane Buffer Layer

19. Preparation of Diamond-Like Carbon on Ti Film with Tetramethylsilane Buffer Layer

21. Internal Quantum Efficiency and Nonradiative Recombination Rate in InGaN-Based Near-Ultraviolet Light-Emitting Diodes

22. Effect of Oxygen Precipitation in Nitrogen-Doped Annealed Silicon Wafers on Thermal Strain Induced by Rapid Thermal Processing

28. 1 V and Stable Dynamic Operation of Laser Diode Using Active Multi-Mode Interferometer

29. Measurement of Strain Distribution in InGaAsP Selective-Area Growth Layers Using a Micro-Area X-Ray Diffraction Method with Sub-µm Spatial Resolution

50. Impurity-free Disordering of InGaAs/InGaAlAs Quantum Wells on InP by Dielectric Thin Cap Films and Characterization of Its In-plane Spatial Resolution

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